Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Credit institution marking method and device, electronic equipment and storage medium

A technology of credit and evaluation indicators, applied in data processing applications, finance, instruments, etc.

Pending Publication Date: 2022-05-13
浙江惠瀜网络科技有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention discloses a marking method for a credit institution, which is used to solve the problem in the prior art that it is impossible to measure the state of the credit institution from multiple angles, find out the abnormal time of the credit institution in time and carry out effective early warning. The method include:

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Credit institution marking method and device, electronic equipment and storage medium
  • Credit institution marking method and device, electronic equipment and storage medium
  • Credit institution marking method and device, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is an embodiment of a part of the application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0043] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0044] Obviously, those skilled in the art should understand...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a credit institution marking method, and the method comprises the steps: constructing an evaluation index system according to the operation state information of a credit institution, and the evaluation indexes comprise a continuous evaluation index and a discrete evaluation index; according to the continuous type evaluation index threshold value and the discrete type evaluation index threshold value, judging the abnormal number of evaluation indexes at each time point in the first preset time period; when it is detected that the number of abnormal evaluation indexes at a first time point is larger than a preset threshold value, the first time point serves as a boundary to conduct abnormal marking on credit institution samples in a second preset time period before the boundary; wherein the continuous evaluation index comprises a first timeout rate, an overdue rate of the first 6 periods, an overdue rate of the first 12 periods, a current 90 + overdue rate, a post-loan fraud rate and a loan rejection rate, and the discrete evaluation index comprises an institution blacklist and an enterprise operation state. By means of the method, the state of the credit institution can be measured from multiple angles, the time when the credit institution is abnormal is found in time, and effective early warning is carried out.

Description

technical field [0001] The present application relates to the technical field of data processing, and specifically relates to a credit institution marking method, device, electronic equipment and storage medium. Background technique [0002] For financial companies that are mainly engaged in offline credit business, the management of their branches is an extremely important part of the risk management system. At present, the commonly used methods for institutional management are mainly to evaluate the quality of their assets, and define the branch's status by overdue indicators. Risk situation, mainly in the form of various overdue indicator monitoring reports, daily, weekly, monthly, quarterly, annual reports, etc.; further, select key indicators and assign different weights and scores, and score and summarize each indicator based on expert experience . [0003] The current marking scheme of the credit institution management model is based on the result marking, which is s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06Q40/02G06Q10/06
CPCG06Q10/06393G06Q40/03
Inventor 周波张建业蔡浴泓陈蓓珍周锋
Owner 浙江惠瀜网络科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com