Test fixture and equipment for connector interface

Abstract

The invention discloses a test fixture and test equipment for a connector interface. The test fixture comprises a connector matching plug, a circuit board and a hybrid test interface. The connector matching plug is provided with a probe, and can be connected with the connector interface in an inserted manner through the probe. Signal wires in one-to-one connection with probes corresponding to to-be-tested pins of the connector interface are laid on the circuit board, and test signals of the to-be-tested pins can be led out through the signal wires. The circuit board is also provided with hybrid test interfaces which are connected with the signal wires one by one; the hybrid test interfaces can be connected with different test devices in a one-to-one matching manner through different test interfaces of the hybrid test interfaces, each test device can directly detect a test signal for detection, the test process is relatively simple, the test difficulty is relatively low especially for aconnector interface with a very small distance between pins, and a short-circuit risk does not exist; moreover, the test fixture provided by the invention can be applied to different test devices fortesting, and is relatively wide in application.

Description

technical field [0001] The invention relates to the field of signal detection, in particular to a test fixture and equipment for a connector interface. Background technique [0002] In order to ensure the security and reliability of the server, it is very important to monitor the integrity of each signal of the server. At present, the probe of the oscilloscope is usually used to perform spot testing on the signal pins on the server motherboard, so as to display the signal waveform on the oscilloscope and measure the signal amplitude, timing, etc., so as to ensure the integrity of the signal. For example, for the PCIE (peripheral component interconnect express, high-speed serial computer expansion bus standard) signal measurement of the SlimSas 8i connector, it is first necessary to find the pin pin for transmitting the PCIE signal corresponding to the interface of the SlimSas 8i connector on the motherboard, and then pass the probe It is cumbersome to conduct manual point m...

AI Technical Summary

Problems solved by technology

For example, for the PCIE (peripheral component interconnect express, high-speed serial computer expansion bus standard) signal measurement of the SlimSas 8i connector, it is first necessary to find the pin pin for transmitting the PCIE signal corresponding to the interface of the SlimSas 8i connector on the motherboard, and then pass the probe It is cumbersome to conduct manual point measurement and then conduct test analysis through an oscilloscope; moreover, the interface of the SlimSas8i connector is small in size, and the distance between pins is very small, making it difficult for the probe to accurately point to the corresponding pin. , the test is more difficult, and it is easy to measure two pins at the same time, there is a risk of short circuit

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