Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multiplication gain fitting measurement method for multiplication CCD

A measurement method and gain control technology, applied in television, electrical components, image communication, etc., can solve problems such as poor stability and large deviation of test results, and achieve the effect of accurately multiplying the gain

Inactive Publication Date: 2020-04-10
HARBIN ENG UNIV
View PDF5 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the identification test, the existing gain test method of EMCCD has problems such as large deviation of test results and poor stability. It is necessary to improve the existing method for the corresponding problems, and design a higher precision and stronger stability. test method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multiplication gain fitting measurement method for multiplication CCD
  • Multiplication gain fitting measurement method for multiplication CCD
  • Multiplication gain fitting measurement method for multiplication CCD

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0027] The invention relates to a multiplication gain measurement method of a multiplication CCD (EMCCD) image sensor, which belongs to the technical field of electronic component testing.

[0028] This method is based on the photoelectric conversion theory and the linear model of the image sensor:

[0029] The imaging area, storage area and readout register of the EMCCD are the same as the traditional frame transfer CCD structure, but a series of gain register structures are added between the readout register and the output amplifier. Based on the structure and working method of EMCCD, attached figure 2 The information flow diagram of EMCCD is given, where the system gain K includes the multiplication gain and output amplifier gain of EMCCD. Through literature research and mathematical modeling, making full use of existing research and experimental conclu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of electronic component testing, in particular to the field of multiplication gain fitting measurement methods for a multiplication CCD (Charge Coupled Device). The method comprises the following steps that a multiplication gain control register is set to be 0, and an EMCCD obtains a set of mean values of image gray scale signals for different exposuretime in a flat field light field and a dark field respectively; a multiplication gain control register is set to be x, and the EMCCD obtains a group of mean values of the image gray signals for different exposure time under the flat field light and the dark field; and fitting two straight lines through a least square method, wherein the ratio of the straight line slope to the straight line slope is the current multiplication gain of the EMCCD. The method has the beneficial effects that the EMCCD multiplication gain measurement method based on multiple groups of data is provided, compared withthe existing method, more accurate multiplication gain can be obtained, and the method is stable, reliable and suitable for engineering application.

Description

technical field [0001] The invention relates to the technical field of testing electronic components, in particular to the field of a multiplied CCD (EMCCD) multiplied gain fitting measurement method. Background technique [0002] EMCCD is an electron multiplier CCD, which is a high-end photoelectric detection product with extremely high sensitivity in the detection field. With the rapid development of EMCCD, it has been widely used in military, astronomical and other fields, and gradually penetrated into all aspects of people's daily life. EMCCD has high quantum efficiency and strong detection efficiency for low-light images, and is an all-solid-state electron multiplier device. Its manufacturing cost is low, its lifespan is long, its stability is high, and its multiplier gain can be adjusted to meet the application requirements of all-weather and large dynamic range. In the identification test, the existing gain test method of EMCCD has problems such as large deviation o...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00
CPCH04N17/00
Inventor 温强金敬文朱垚鑫
Owner HARBIN ENG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com