TEST TRAY AND sorting machine for testing electronic components

Abstract

The invention relates to a test tray and a sorting machine for testing electronic components, which are used for testing the electronic components. In order to move electronic components in stages ina test zone, the test tray is provided with a separate movable loading frame for loading the electronic components, and the sorting machine is provided with a step-by-step support device for moving the loading frame. According to the present invention, it is possible to minimize a decrease in processing capacity even when an electronic component to be tested is of a high specification or of a large size, and it is also possible to achieve reuse of a test machine and to reduce resource waste or cost burden.

Description

technical field [0001] The present invention relates to a test tray used in the testing of electronic components and a sorter for testing electronic components that moves the corresponding test trays and supports the testing of electronic components. Background technique [0002] The produced electronic components such as semiconductor elements are tested by a testing machine and are classified into good and bad products, and only good products are shipped. [0003] The electrical connection between the testing machine and the electronic components is realized by a sorting machine for testing electronic components (hereinafter, abbreviated as "sorting machine"). [0004] Usually, the sorter is manufactured in various forms according to various types of electronic components to be tested. Such sorters can be roughly classified into whether or not a test tray is used. [0005] Some kinds of sorting machines have a structure in which the electronic components are directly ele...

AI Technical Summary

Problems solved by technology

[0013] Therefore, if during the circular movement of the test tray, the moving direction of the test tray carried out in the test section is inconsistent with the step-by-step moving direction (direction perpendicular to the moving direction of the test tray) of the electronic components used for the step-by-step test, existing technology cannot be applied

And, in this case, the first or second method above must still be adopted, which means that the above-mentioned cost burden or a large reduction in processing speed will still be incurred

Of course, since the step-by-step movement direction of electronic components is determined according to the structure of the tester, if the owner of the sorter changes the test The specification of the sorting machine solves the difficulty, but it is difficult to expect the owner to change the high-priced testing machine that is much more expensive than the sorting machine

i.e. from the owner's point of view the tester is very expensive and thus would prefer continued use rather than replacement, hence the need to replace or retrofit a sorter which is relatively less expensive than the tester

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