Device for measuring shaping index of all-optical regenerator

A technology of optical regenerators and measurement devices, which is applied in the field of optical communications, can solve the problems of high cost of measurement equipment, difficult optical signal-to-noise ratio performance of optical regenerators, and high cost of measurement devices, so as to avoid the influence of optical receiver noise, Intuitive and reliable measurement results, low cost effect

Active Publication Date: 2020-02-28
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

However, these methods are all indirect measurement techniques based on digital signal processing algorithms in the coherent receiver, and the cost of the required measurement equipment is high; in addition, the optical receiver will introduce additional photoelectric noise, which is difficult to truly reflect the all-optical regenerator Optical signal...

Method used

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  • Device for measuring shaping index of all-optical regenerator
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  • Device for measuring shaping index of all-optical regenerator

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Embodiment

[0033] figure 1 It is a structural diagram of a specific embodiment of a measuring device for the shaping index of an all-optical regenerator according to the present invention.

[0034] In this example, if figure 1 As shown, a measuring device for the shaping index of an all-optical regenerator of the present invention includes: an optical signal generating unit, a power-adjustable optical amplifier, an ASE noise loading module, an optical splitter, an all-optical regenerator to be tested, and an optical power meter; Taking an all-optical regenerator with quadrature phase-shift keying (QPSK) modulation format as an example, the present invention will be described in detail.

[0035] The optical signal generating unit is used to generate a test optical signal matching the all-optical regenerator to be tested; in the optical signal generating unit, a continuous optical laser is injected into the optical modulator to obtain a test signal light source, and a low-frequency RF ele...

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Abstract

The invention discloses a device for measuring the shaping index of an all-optical regenerator. The device comprises an optical signal generation unit, a power-adjustable optical amplifier, an ASE noise loading module, an optical splitter, an all-optical regenerator to be measured and an optical power meter, specific test time, the noise loading power of the ASE noise loading module is adjusted; completing the measurement of the power transfer function of the to-be-measured all-optical regenerator, the gain size of the working point, the optical signal to noise ratio of the input degradation signal and the total gain of the degradation signal, and finally calculating an optical shaping index parameter which can be used for representing the optical signal to noise ratio improvement capability of the all-optical regenerator according to the measurement index.

Description

technical field [0001] The invention belongs to the technical field of optical communication, and more specifically relates to a measuring device for the shaping index of an all-optical regenerator. Background technique [0002] With the rapid growth of capacity requirements of optical communication systems, optical networks are developing towards intelligent all-optical networks and dynamic resource scheduling. In order to ensure the stability and reliable service of the optical communication system, it is necessary to monitor the optical performance of the optical network performance or the all-optical information processing devices that make up the optical network. Optical Signal-to-Noise Ratio (OSNR) has become one of the most important performance monitoring parameters of optical network nodes. The traditional optical signal-to-noise ratio measurement method first uses a spectrometer to measure the out-of-band noise, and then interpolates and integrates the out-of-band...

Claims

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Application Information

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IPC IPC(8): H04B10/079H04B10/299
CPCH04B10/0795H04B10/299
Inventor 武保剑万峰文峰邱昆
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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