An integrated circuit pin clamping abnormality detection and protection device

Abstract

The invention discloses an integrated circuit pin clamping abnormal detection and protection device, which includes a detection relay, an AC signal generating circuit, a rectification filter circuit, an adjustable voltage reference circuit, a comparison circuit, a self-locking circuit, a clamping abnormal driving circuit, and a clamping circuit. Holding abnormal alarm circuit, clamping normal driving circuit, clamping normal indicating circuit, test power supply, power supply relay and power supply delay driving circuit; when the integrated circuit pin is clamped normally and abnormally, the reactance between the pins is different Yes, different reactances have different influences on the detection signal, so the present invention uses the influence of the reactance between the integrated circuit pins on the detection signal to detect the clamping condition of the integrated circuit pin by the test fixture, thereby realizing abnormal clamping Judgment and detection of the situation, when an abnormality occurs, cut off the test power applied to the integrated circuit, so as to realize the protection of the integrated circuit.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to an integrated circuit pin clamping abnormal detection and protection device. Background technique [0002] Integrated circuit testing plays a very important role in the development, production and use of integrated circuits, and it is very necessary to realize reliable testing of integrated circuits. [0003] When testing an integrated circuit, if the contact between the pins of the integrated circuit and the test fixture is not good, the test result will be unreliable if it is light, and the integrated circuit will be damaged if it is serious. At present, there is no technical way to judge the situation of the test fixture clamping the integrated circuit pins. It is only judged according to the test results after inserting and unplugging the integrated circuit from the test fixture many times. This method is very inconvenient, low in efficiency, and sometimes ...

AI Technical Summary

Problems solved by technology

[0003] When testing an integrated circuit, if the contact between the pins of the integrated circuit and the test fixture is not good, the light will lead to unreliable test results, and the severe one will cause damage to the integrated circuit

At present, there is no technical way to judge the situation of the test fixture clamping the integrated circuit pins. It is only judged according to the test results after inserting and unplugging the integrated circuit from the test fixture many times. This method is very inconvenient, low in efficiency, and sometimes causes integration problems. circuit damage

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