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Method for measuring non-extensive parameters of plasma electrons

A plasma, non-extensive technology, applied in the direction of plasma, electrical components, etc., can solve the problem of inability to measure plasma non-extensive parameters

Active Publication Date: 2020-01-31
NANCHANG UNIV
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0004] Aiming at the above-mentioned technical problem of being unable to measure plasma non-extensive parameters, the present invention provides a method for measuring plasma electronic non-extensive parameters

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  • Method for measuring non-extensive parameters of plasma electrons
  • Method for measuring non-extensive parameters of plasma electrons
  • Method for measuring non-extensive parameters of plasma electrons

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Embodiment Construction

[0019] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0020] A method for measuring plasma electronic non-extensive parameters, using non-extensive statistical mechanics and electrical probes to measure plasma non-extensive parameters.

[0021] The specific steps are:

[0022] The first step is to use non-extensive statistical mechanics to describe the plasma, and obtain the formula of the non-extensive electric single-probe I-V curve; the second step is to collect the experimental data of the electric single-probe I-V; the third step is to use the first step to obtain The non-extensive electric single probe I-V curve formula is used for nonlinear fitting of the electric single probe I-V experimental data collected in the second step, and the fourth step is for the goodness of fit curves, such as Figure 4 shown. The fifth step is to obtain the electronic non-extensive parameter value corresponding to the minimum SS...

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Abstract

The invention relates to a method for measuring the non-extensive parameters of plasma electrons. According to the method, the non-extensive parameters of plasmas are measured by adopting non-extensive statistical mechanics and an electric probe; the plasmas are described by the non-extensive statistical mechanics, and a non-extensive electric single probe (measurement) theory is established on the basis of the non-extensive statistical mechanics; and electronic non-extensive parameters which cannot be measured by a traditional electric single probe are measured by applying the non-extensive electric single probe; and electronic temperature, plasma potential, electron density and suspension potential which are more accurate than those obtained by the traditional single probe are obtained.With the method provided by the technical schemes of the invention adopted, the non-extensive electric probe plays a role in plasma diagnosis, the non-extensive performance of the plasmas is measured,and the diagnosis precision of other plasma parameters is improved.

Description

technical field [0001] The invention relates to the field of diagnosis of plasma non-extensive parameters, in particular to a method for measuring plasma electronic non-extensive parameters. Background technique [0002] Plasma exists widely in the universe, and is often regarded as the fourth state of matter except solid, liquid, and gas. When a solid is heated to the melting point, the average kinetic energy of the particles exceeds the binding energy of the lattice, and the solid turns into a liquid; when the liquid is heated to the boiling point, the kinetic energy of the ions exceeds the binding energy between the particles, and the liquid turns into a gas. If the gas is further heated, the gas will be partially ionized or completely ionized, that is, the outer electrons of the atoms will get rid of the shackles of the nucleus and become free electrons, and the atoms that have lost their outer electrons will become charged ions. When the proportion of charged particles...

Claims

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Application Information

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IPC IPC(8): H05H1/00
CPCH05H1/0006H05H1/0081H01J37/32926
Inventor 邱慧斌周振宇刘三秋
Owner NANCHANG UNIV
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