Detection structure and method of ATE system

Abstract

The invention discloses a detection structure of an ATE system. The structure comprises a test resource board and a load board. The test resource board comprises a controller and n test channels connected with the controller. The load board comprises a detection unit, a bus and n resistors with a same resistance value R. The n test channels are connected with one ends of the n resistors, and the other ends of the n resistors are connected to the detection unit through the bus. A voltage Vbus is applied to the detection unit, a first test channel to the Nth test channel are sequentially opened,a current Im on the bus is measured, and whether a mth test channel is normal is judged according to the Im. By using the detection structure and method of the ATE system, a position of the test channel with a fault can be accurately positioned, and a reason why the test channel has the fault can be quickly judged.

Description

technical field [0001] The invention relates to ATE system detection, in particular to an ATE system detection structure and method. Background technique [0002] In the ATE (Automatic Test Equipment) system, there are a large number of test channel resources of the OD (opendrain) gate structure on the test resource board to detect or control the unit under test on the load board. as attached figure 1 As shown, the ATE system includes a test resource board and a PB board / load board, wherein the test resource board includes a controller and n test channels connected to the controller, the load board includes a unit under test, and the n test channels are The cable is connected to the unit under test. [0003] In reality, due to the defect of the device itself or the damage introduced during the production and assembly process, one or more test channels may fail. Therefore, before the test product is officially shipped, it is necessary to perform failure diagnosis of the te...

AI Technical Summary

Problems solved by technology

[0004] However, there are often hundreds or even thousands of OD gate test channels in the entire ATE test system. If you want to test the quality of each channel individually, you need a large number of hardware detection pins, and the design cost is high.

The current detection structure and method have defects such as inability to accurately locate the fault channel location, low efficiency, or some fault blind spots.

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