Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for effectively prolonging service life of NAND startup

A life-span and start-up module technology, which is applied in the input/output process of data processing, instruments, input/output to record carriers, etc., can solve problems such as serious wear and tear, reduced service life of solid-state hard drives, and increased risk of NAND startup failure. Achieve the effect of reducing loss and reducing the number of revisions

Pending Publication Date: 2019-10-01
SHENZHEN YILIAN INFORMATION SYST CO LTD
View PDF4 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the traditional solid-state hard disk starts, the chip will read the firmware from the fixed address of NAND FLASH. However, if the data is read from the fixed address for a long time or the firmware is continuously updated, the loss of this address will be more serious. The number of writes is limited, and as time goes by, the risk of NAND boot failure greatly increases, which greatly reduces the service life of the SSD; therefore, it cannot meet the demand

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for effectively prolonging service life of NAND startup
  • Method and system for effectively prolonging service life of NAND startup
  • Method and system for effectively prolonging service life of NAND startup

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] In order to fully understand the technical content of the present invention, the technical solutions of the present invention will be further introduced and illustrated below in conjunction with specific examples, but not limited thereto.

[0043] Such as Figure 1 to Figure 5 Specific examples shown, where, as Figure 1 to Figure 2 Shown prior art, such as figure 1 As shown, when the chip is started, the bootrom (chip) reads the firmware from the fixed address of the NAND particle. The fixed address has been predetermined in the bootorm and cannot be modified, which makes the chip fail in the future. Greatly increased; because the address is fixed and cannot be modified, when the address is read or written multiple times, the loss of NAND particles will increase, and the number of reads and writes of the particles is limited. If the number of reads and writes is too large, the lifespan will be greatly reduced , and ultimately affect the startup of the chip and the se...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method and a system for effectively prolonging the service life of NAND startup. The method comprises the steps that S1, starting a chip, and completing initialization; s2,reading address information of the firmware from the NAND particle fixed address X0; s3, judging whether reading is successful or not; if yes, entering S5; if not, entering S4; s4, selecting the nextfixed address Xn of the fixed address X0 for reading, and returning to the step S3; s5, reading the bootstrap program from the read address, and verifying the bootstrap program; s6, judging whether the verification is successful or not; if yes, entering S7; if not, returning to S4; s7, running firmware. Through two-stage mapping, the read fixed address is subjected to multiple backups, and firmware is separated from the storage address, so that repeated erasing and writing of the same address by NAND particles are reduced, the service life of chip NAND starting is prolonged, and the service time of the solid state disk is prolonged.

Description

technical field [0001] The invention relates to the technical field of NAND start-up of solid-state hard disks, and more specifically refers to a method and system thereof for effectively improving the service life of NAND start-up. Background technique [0002] Chips using Nand FLASH to start are widely used in solid-state drives. It not only has a fast start-up speed, but also reduces the cost of solid-state drives. When the traditional solid-state hard disk starts, the chip will read the firmware from the fixed address of NAND FLASH. However, if the data is read from the fixed address for a long time or the firmware is continuously updated, the loss of this address will be more serious. The number of writes is limited, and as time goes by, the risk of NAND startup failure increases greatly, which greatly reduces the service life of the SSD; therefore, it cannot meet the demand. Contents of the invention [0003] The purpose of the present invention is to overcome the d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F3/06
CPCG06F3/0616G06F3/0632G06F3/0679
Inventor 刘坚冯元元臧鑫
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com