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PIN needle position degree detection method for large-size product with sub-pixel precision

A detection method and sub-pixel technology, applied in measurement devices, optical devices, instruments, etc., can solve the problems of unsatisfactory measurement accuracy, long measurement time, poor accuracy, etc., to facilitate tracking and analysis, reduce errors, and realize storage. Effect

Active Publication Date: 2019-07-30
怡得乐电子(杭州)有限公司
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Problems solved by technology

[0002] In industrial production, there are a large number of products with different shapes, which require high-precision dimensional measurement. For larger-sized products, because the traditional image detection system can only process one image, the measurement accuracy cannot meet the requirements.
[0003] For larger-sized products, the method of directly stitching two images is usually used at present, the accuracy is poor, and the error caused by stitching exceeds 1 pixel, so it cannot be used for size measurement; Image, because it is easily affected by factors such as motion stability and external vibration when acquiring the image, it is not suitable for size measurement, and the measurement time is long

Method used

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  • PIN needle position degree detection method for large-size product with sub-pixel precision

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Embodiment Construction

[0046] The technical solutions protected by the present invention will be specifically described below in conjunction with the accompanying drawings.

[0047] Please refer to figure 1 . The PIN pin position detection method for large-size products with sub-pixel precision proposed by the present invention is realized by a PIN pin detection system. The PIN pin detection system includes a hardware part and a software part, wherein the hardware part includes a PIN pin detection device and an industrial computer. , the software part runs on the industrial computer, and the industrial computer controls the work of the PIN needle detection device, and processes, stores and displays the images and data acquired by the PIN needle detection device.

[0048] Described PIN pin detection equipment comprises servo system, light source 12 and camera 11, wherein, light source 12 is arranged on the top of servo system, and described camera 11 is arranged on the top of described light source ...

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Abstract

The invention provides a PIN needle position degree detection method for a large-size product with sub-pixel precision. By fixing positions of a camera and a light source and using a servo system to drive the product to move, the product is divided into a plurality of subsections used to respectively acquire images of each subsection. The common pixel points in each image are used to unify the image coordinate system of each subsection image. At the same time, a new reference coordinate system is established, and finally, the calculated distance between the needle point of the PIN needle and the new reference is compared with a set tolerance value, and therefore qualified products and non-qualified products are distinguished. According to the invention, the method of obtaining a size of alarge-size product by adopting an image stitching method is abandoned, and therefore errors caused by splicing can be greatly reduced, and the processing pixel has a sub-pixel function. In addition, the detection method is suitable for cameras of different brands, can be applied to detection of different products, and is high in universality and compatibility.

Description

technical field [0001] The invention relates to the field of PIN needle position degree detection, in particular to a PIN needle position degree detection method for large-size products with sub-pixel precision. Background technique [0002] In industrial production, there are a large number of products of various shapes that require high-precision dimensional measurement. For larger-sized products, since the traditional image detection system can only process one image, the measurement accuracy cannot meet the requirements. [0003] For larger-sized products, the method of directly stitching two images is usually used at present, the accuracy is poor, and the error caused by stitching exceeds 1 pixel, so it cannot be used for size measurement; Image, because it is easily affected by factors such as motion stability and external vibration when acquiring the image, is not suitable for size measurement, and the measurement time is long. Contents of the invention [0004] In...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
CPCG01B11/002
Inventor 陈伟斌程小斌
Owner 怡得乐电子(杭州)有限公司
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