Quantitative defect detection method and device for moving metal components

A quantitative detection method and technology of metal components, applied in the direction of material magnetic variables, etc., can solve the problems of detection speed limitation, inability to realize quantitative defect identification, blind areas of surface and sub-surface cracks, etc., achieve huge economic benefits and improve quality monitoring capabilities , Improve the effect of market competitiveness

Active Publication Date: 2019-07-26
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF6 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] The purpose of the present invention is: in order to solve the problem that existing defect detection methods for moving metal components have blind spots for surface and sub-surface cracks, cannot realize quantitative defect identification or can realize quantitative defect identification, but the detection speed is limited, etc. The invention proposes a defect quantitative detection method and device of a moving metal component, which effectively improves the sensitivity and signal strength of the defect detection of the moving metal component, and realizes the rapid quantitative identification of the defect of the moving metal component

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Quantitative defect detection method and device for moving metal components
  • Quantitative defect detection method and device for moving metal components
  • Quantitative defect detection method and device for moving metal components

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0051] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0052] figure 1 It is a schematic flow chart of a defect quantitative detection method for a moving metal component of the present invention; a quantitative defect detection method for a moving metal component comprises the following steps:

[0053] S1. Fix the detection probe above the moving metal component, and pass direct current into the excitation coil of the detection probe to generate a constant magnetic field;

[0054] S2. Determine the installation position of the magnetic sensor, and use the magnetic sensor to collect the magnetic induction intensity signal of the magnetic field in step...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a quantitative defect detection method and device for moving metal components. The quantitative defect detection method includes the steps that a constant magnetic field is generated by a fixed detection probe; the position of a magnetic sensor is set and magnetic induction intensity signals are collected, and the magnetic induction intensity signals are subjected to amplifying and filtering processing; the peak value of a response signal and the baseline value are subjected to difference processing to obtain the difference peak value; and an inversion model of moving metal component defect parameters is constructed and the defect parameters are calculated. The device includes an excitation signal generating module, a signal amplification and filtering module, a data acquisition and processing module and a defect parameter calculating module. According to the quantitative defect detection method and device for the moving metal components, the quantitative detection of defects in the moving metal components is realized by using motional eddy currents generated by the relative movement between the detection device and the detected metal components, so that thequality monitoring ability of metal parts is improved, the market competitiveness of the metal parts is improved, and thus huge economic and social benefits are brought.

Description

technical field [0001] The invention belongs to the technical field of defect detection of metal components, and in particular relates to a defect quantitative detection method and device of a moving metal component. Background technique [0002] Non-destructive testing (NDT, Nondestructive Testing) technology refers to the internal and surface structure, nature, state and Effective detection of physical properties such as defects. As a branch of nondestructive testing, electromagnetic nondestructive testing technology detects defects in materials through changes in the electromagnetic properties of materials, making this testing method widely used in transportation such as aircraft fuselage structures, steam pipelines, and oil and natural gas. Production quality monitoring and online health status detection of metal components such as pipelines and railway rails. Electromagnetic nondestructive testing methods mainly include: eddy current testing, magnetic flux leakage tes...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/85G01N27/90
CPCG01N27/85G01N27/90
Inventor 于亚婷袁飞刘博文李林峰
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products