Method for testing simulated sound reduction index of large wallboard component based on low-temperature test box device

Abstract

The invention discloses a method for testing a simulated sound reduction index of a large wallboard component based on a low-temperature test box device, and belongs to the field of testing methods for sound insulation performance of materials in a low-temperature state. According to the method, an ultra-low temperature small test box with a refrigeration function is used in combination with an anechoic chamber, so that a standard sound-proof chamber with high temperature control cost is simulated and replaced; meanwhile, the large-scale wallboard part required to be tested is cut into a rectangular small-size sample plate part with a reduced size, so that a standard test window in the standard sound-proof chamber is simulated by utilizing a rectangular simulation test window arranged on the ultralow-temperature small test box, and thus the interior of the small test box body is simulated as a sounding chamber in the standard sound-proof chamber, the silent environment of the anechoicchamber outside the small test box body is simulated as a sound receiving chamber in the standard sound-proof chamber, and acoustic measurement of the simulated sound reduction index of the small-sizesample plate part is completed. The low-temperature test box device is simple and practical in structure and easy to operate, and the method for testing the simulated sound reduction index based on the device is low in cost.

Description

technical field [0001] The invention belongs to the field of test methods for sound insulation performance of materials at low temperature, and in particular relates to a test method for simulating sound insulation of large wallboard components based on a low temperature test chamber device. Background technique [0002] Sound insulation is a measure of the sound absorption and sound insulation performance of reactive materials. The standard sound insulation test method is carried out in a standard sound insulation room including a sound emitting room and a sound receiving room, and is used to separate the sound emitting room and the sound receiving room. There is a standard test window of 1m x 1m in the center. When in use, at a room temperature of 25°C, the standard test window is soundproofed and sealed with the tested plate, and then the test window is tested from a position 1000mm away from the center of the standard test window in the sound chamber. The sound generator...

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problem that the existing standard sound insulation room cannot provide a test environment under the temperature condition of -50°C, and its temperature control transformation scheme is costly and economically ineffective; The installation process between the panel parts and the standard test window in the sound insulation room is time-consuming, which leads to the technical problems that the large-scale wall panel parts heat up quickly and the test accuracy is not ideal. The invention provides a large-scale Test method for simulated sound insulation of wall panel components

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