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Element analysis device and element analysis method

A technology of elemental analysis and quantitative analysis, applied in the direction of measuring devices, analysis materials, sampling devices, etc., to achieve the effect of stable calibration and high-precision analysis

Pending Publication Date: 2019-07-19
HORIBA LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, the reason for introducing the calibration gas in the unheated state of the heating furnace is to avoid the reaction of the graphite crucible with hydrogen. For this reason, there has been no idea of ​​heating the heating furnace before the introduction of the calibration gas.

Method used

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  • Element analysis device and element analysis method
  • Element analysis device and element analysis method

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Embodiment Construction

[0047] Next, an embodiment of the elemental analysis device of the present invention will be described with reference to the drawings.

[0048]

[0049] The elemental analysis device 100 of the present embodiment is used to analyze at least hydrogen contained in a metal material as a measurement sample. In the heating furnace 1, a graphite crucible R for accommodating the measurement sample is sandwiched by a pair of electrodes as a heating mechanism. By directly applying a voltage to the crucible R, the crucible R and the measurement sample in the crucible R are heated, the sample gas generated thereby is analyzed, and the hydrogen contained in the measurement sample is quantitatively analyzed.

[0050] In addition, the elemental analysis device 100 of this embodiment can be suitably used as a measurement sample if it is a steel material that needs to be evaluated at an extremely low hydrogen (H) concentration (for example, about several ppm) among metal materials.

[0051]...

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Abstract

An element analysis device (100) for quantitatively analyzing hydrogen included in a metal material in order to enable calibration to be stably performed and enable more accurate and highly precise analysis than the prior art, wherein the element analysis device (100) is provided with a heating mechanism for heating a metal material placed in a crucible R in a heating furnace (1), an oxidizer (31)for oxidizing H<2> gas generated from the heated metal sample to H<2>O gas, a non-dispersive infrared detector (32) for detecting H<2>O gas oxidized by the oxidizer (31), and a control device (5) forcontrolling the heating mechanism, the control device (5) being configured so as to control the heating mechanism and heat the inside of the heating furnace (1), and degas the inside of the heating furnace (1) before a calibration gas is introduced into the heating furnace (1) in a calibration step for measuring a calibration gas having a predetermined H<2> concentration.

Description

technical field [0001] The invention relates to an element analysis device and an element analysis method. Background technique [0002] As shown in Patent Document 1, as an element analysis device for analyzing hydrogen contained in a measurement sample, there is a device in which the measurement sample is placed in a graphite crucible that generates Joule heat by passing a pulse current. The measurement sample is heated and melted, and the elements in the measurement sample are detected as gas components by a non-dispersive infrared detector (NDIR) and quantitatively analyzed. [0003] When using this elemental analyzer to analyze hydrogen (H) in a measurement sample, hydrogen (H) gas (H 2 gas), hydrogen (H 2 ) is oxidized to water (H 2 O) and for H 2 O to detect. [0004] Thus, by using a non-dispersive infrared detector in the detection of hydrogen (H), using this non-dispersive infrared detector, in addition to hydrogen (H), oxygen (O) and nitrogen (N ) and other ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N31/00G01N1/00G01N1/22G01N31/12
CPCG01N1/00G01N1/22G01N31/00G01N31/12
Inventor 荒井正浩平野彰弘西方康博
Owner HORIBA LTD
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