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Light source device for SMD wafer ultra-micro masked crack detection

A technology for crack detection and light source device, which is used in measurement devices, optical testing of flaws/defects, material analysis by optical means, etc. Detection efficiency and detection accuracy, the effect of efficient and accurate detection

Active Publication Date: 2019-07-09
铜陵市多元微分科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Unable to detect ultra-dim cracks on wafers

Method used

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  • Light source device for SMD wafer ultra-micro masked crack detection
  • Light source device for SMD wafer ultra-micro masked crack detection
  • Light source device for SMD wafer ultra-micro masked crack detection

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Embodiment Construction

[0019] Combine below figure 1 , to further illustrate the present invention.

[0020] Such as figure 1 As shown, a light source device for detecting ultra-dark cracks in SMD wafers, including a light-condensing tube 1, the upper side of the light-condensing tube 1 is connected to the upper light source 4 through the light-condensing tube gland 2, and the light-condensing tube 1. The lower side is connected to the lower light source 5 through the lower rotating plate 3; the upper light source 4 is a vertical light source, and the lower light source 5 is an oblique light source with an inclination angle of 61-64°; the upper light source 4 is composed of 96 LEDs The electric beads are evenly distributed in two rows, and the inner diameter of the light source is 60-62 mm. The lower light source 5 is divided into three rows of 145 LED resistors, and the inner diameter of the light source is 64-65 mm.

[0021] Since SMD wafers not only have dark cracks below 0.009mm, but also have...

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Abstract

The invention discloses a light source device for SMD wafer ultra-micro masked crack detection. The light source device comprises a light-focusing barrel, an upper side of the light-focusing barrel isconnected with an upper light source through a gland of the light-focusing barrel, and a lower side of the light-focusing barrel is connected with a lower light source of a lower rotating plate; theupper light source is a vertical light source, and the lower light source is an inclined light source with an inclination angle of 61-64 DEG; the upper light source is formed by uniformly and alternately distributing 96 LED bulbs in two rows, and the inner diameter of the light source is 60-62mm; the lower light source is formed by uniformly and alternately distributing 145 LED bulbs in three rows, and the inner diameter of the light source is 64-65mm. The lower light source disclosed by the invention is adjusted according to the lower rotating plate of the light-focusing barrel, the adjustingis convenient and simple; and the detection efficiency and the detection accuracy of the masked crack under 0.009mm of a SMD wafer are effectively.

Description

technical field [0001] The invention relates to the field of wafer detection, in particular to a light source device for detection of dark cracks below 0.009mm in SMD wafers. Background technique [0002] SMD chip is the abbreviation of Surface Mounted Devices, which is a surface mount device. It ushered in a new era. From passive components to active components and integrated circuits, all eventually become surface mount devices (SMD) and can be assembled by pick-and-place equipment. It has the following advantages: 1) High assembly density, small size and light weight of electronic products. The volume and weight of SMT components are only about 1 / 10 of traditional plug-in components. Generally, after SMT is used, the volume of electronic products is reduced by 40%~60% %, the weight is reduced by 60%~80%. 2) High reliability and strong anti-vibration ability. Solder joint defect rate is low. 3) Good high frequency characteristics. Reduced electromagnetic and radio fr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/95G01N21/01
CPCG01N21/8806G01N21/9505G01N21/01G01N2021/8809G01N2201/061
Inventor 张国安徐伟钢
Owner 铜陵市多元微分科技有限公司
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