Panel withdrawing system and method for defect analysis
A bad, report system technology, applied in the direction of nonlinear optics, instruments, optics, etc., can solve the problems of inability to achieve full automation, consume a lot of manpower, and delay in pulling out the chip, and achieve the goal of improving the level of automation and intelligent operation Effect
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[0032] See figure 2 , the present invention provides a system for taking films for defective analysis, including a report system and an operation system connected in series with the report system; the report system collects and displays panel information on the production line, and the report system collects and displays panel information on the production line. The operating system specifies the flow direction of the panels on the production line; the user inputs slice logic to the report system, and the report system has a built-in logic development module, and the report system uses the logic development module according to the slice logic Select the panel that needs to be parsed, and pass the data information of the panel that needs to be parsed to the operating system. The panels are forwarded to the extraction site.
[0033] Specifically, the system for taking slices for defective analysis further includes a terminal device, the terminal device has a system management ...
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