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Service life evaluation method and device

A technology of life evaluation and life value, which is applied in the field of life evaluation methods and devices, can solve problems such as long evaluation time, and achieve the effect of shortening evaluation time and shortening acquisition time

Active Publication Date: 2019-06-07
广电计量检测(北京)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004]Based on this, it is necessary to provide a life assessment method and device that can perform life assessment in a short period of time for the problem that the traditional life assessment method takes too long to evaluate

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  • Service life evaluation method and device

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Embodiment Construction

[0046] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. A preferred embodiment of the application is shown in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.

[0047] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terms used herein in the specification of the application are only for the purpose of describing specific embodiments, and are not intended to limit the application. As used herein, the term "and / or" includes any and all combinations of one or more of the associa...

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Abstract

The invention relates to a service life evaluation method and device. The service life evaluation method comprises the following steps: acquiring a first failure rate of a to-be-tested device at a limit working temperature and a second failure rate at a preset temperature; processing the first failure rate and the second failure rate to obtain an acceleration factor; obtaining a first service lifevalue of the to-be-tested device at a limit working temperature; And processing the acceleration factor and the first life value to obtain a second life value of the to-be-tested device at a preset temperature. According to the invention, the acceleration factor is obtained based on the first failure rate and the second failure rate. The acquisition time of the acceleration factor is shortened. According to the method, the acceleration factor is obtained, and the service life value at the preset temperature is obtained according to the acceleration factor and the service life value at the limit working temperature, so that the service life of the to-be-tested device is evaluated, the problem that the evaluation time is too long due to too long test time in the test is avoided, the servicelife evaluation time is shortened, and the service life evaluation is completed within a short time.

Description

technical field [0001] The present application relates to the technical field of life assessment, in particular to a life assessment method and device. Background technique [0002] With the development of manufacturing technology and the upgrading of materials and production processes, the life of irreparable components, such as IC (Integrated Circuit, integrated circuit), ceramic capacitors, and thin film resistors, has become very long. Predicting the life of products can make related products Better performance of its existing performance plays a vital role in the reliability of product application and the accuracy of maintenance. [0003] During the implementation process, the inventors found at least the following problems in the traditional technology: the current life evaluation method has the problem of too long evaluation time. Contents of the invention [0004] Based on this, it is necessary to provide a life assessment method and device capable of performing l...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/10
Inventor 徐立立杨静吴超云
Owner 广电计量检测(北京)有限公司
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