Temperature control device applied to single resistance micro hot plate

Abstract

The invention relates to a temperature control device, in particular to a temperature control device applied to a single resistance micro hot plate, comprising a test current circuit and a heating current circuit. The temperature control device applied to the single resistance micro hot plate has the following advantages: (1) the test current circuit with an adaptive adjustment function is designed, and for different target operating temperatures, the circuit can automatically switch to the appropriate test current to reduce the temperature fluctuation range, thus achieving high-precision temperature control; (2) a clock generation circuit with a microsecond level period is designed, the internal integration of the clock signal circuit is realized, and high integration is realized; and (3)a heating mode control circuit is designed, which can realize switch between a continuous heating mode and a gap heating mode through a heating mode control signal, and can control the heating cycleand duty ratio of the gap heating mode, so as to achieve low power consumption.

Description

Technical field [0001] The invention relates to a temperature control device, and more specifically, to a temperature control device for a single-resistance micro hot plate. Background technique [0002] In the micro hot plate sensor, in order to improve the integration and reduce the cost, the only resistance (single resistance) is often designed. When the current passes through this resistor, heat energy is generated due to Joule heating effect to increase the temperature of the micro hot plate; at the same time, this resistor also has a stable temperature resistivity, and its resistance increases or decreases monotonically with temperature changes. Value to get the average temperature of the micro hot plate. Most of the existing temperature control circuits are only suitable for the case where the heating device and the temperature measuring device are separated, such as the authorized invention patent "Accurate temperature control circuit for anti-irradiation infrared detect...

AI Technical Summary

Problems solved by technology

The problem is that due to the use of a fixed test current, if it is necessary to achieve temperature control in the lower temperature zone, the test current must be small enough, resulting in a lower upper limit temperature of the micro-hot plate and poor temperature control accuracy in the high temperature zone; For precise temperature control in the high-temperature zone, the test current must be large enough to cause the lower limit temperature that the micro-hot plate can reach to be too high

Therefore, the circuit with a single test current has the problems of narrow temperature control range and poor temperature control accuracy.

In addition, in the published relevant literature, most of the clock pulse signals are externally connected, and internal integration has not yet been seen.

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