Silicon-base nano-antenna with unidirectional radiation characteristic
A radiation characteristic and nano-antenna technology, applied in the field of optical phased array, can solve problems such as energy waste, energy leakage, and low efficiency, and achieve the effect of realizing one-way radiation, suppressing leakage, and improving efficiency
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Embodiment 1
[0016] Embodiment 1 Nano patch linear array design
[0017] The nano-patch array on the silicon substrate based on the gap coupling of this embodiment adopts a linear array form, such as figure 1 shown. The bottom silicon layer 101, the silicon dioxide layer 102, and the strip silicon waveguide 103 together constitute a typical SOI structure, and the silicon waveguide is covered with a silicon dioxide cladding layer 104. The upper side of the silicon dioxide coating is a metal film 105, and a small hole array 106 is etched on the metal film. The topmost layer is the nano patch array 108, and there is a silicon dioxide thin layer 106 support between the nano patch array 108 and the metal film 105. figure 2 shown as figure 1 A cutaway view of the center of the antenna. The width and height of the strip silicon waveguide 103 are 460 nm and 240 nm, respectively. The thickness of the silver thin film 105 is 80 nm, and the length and width of the nanometer holes 106 on the sil...
Embodiment 2
[0020] Embodiment 2 nano-patch optical phased array design
[0021] Specifically, the linear array in Embodiment 1 is extended perpendicular to the feeding direction to form a two-dimensional array. Beam scanning can be realized by changing the feed phase of each linear array. Its size parameter is the same as that of Example 1, and the distance between channels is 0.9 μm. Image 6 The beam scanning pattern of the optical phased array in this example under different phase differences between channels is given. It can be seen that with the proposed antenna, beam scanning without grating lobe of ±45° can be achieved. And in the whole scanning range, there is no obvious back lobe, indicating that the leakage on the substrate side is effectively suppressed.
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