Overturning feeding device of IC chip testing machine

Abstract

The invention discloses an overturning feeding device of an IC chip testing machine. The overturning feeding device comprises a material carrying table used for placing an IC material pipe, a feedingmechanism used for taking an IC chip out, and a material channel used for conveying the IC chip. The material carrying table is provided with a material cabin and a push mechanism. The push mechanismcan clamp the IC material pipe in the material cabin and push the IC material pipe out to a preset position of the material carrying table. The feeding mechanism comprises a clamping mechanism used for clamping the IC material pipe on the material carrying table, and an overturning mechanism. The clamping mechanism can clamp the IC material pipe. The overturning mechanism drives the clamping mechanism to overturn, and therefore the clamped IC material pipe is perpendicular to the material carrying table and communicates with the material channel, and the IC chip in the IC material pipe can slide into the material channel from the IC material pipe. The overturning mechanism overturns the clamping mechanism clamping the IC material pipe, and therefore the clamping mechanism is changed from ahorizontal state to a vertical state, so that the IC chip in the IC material pipe slides into the material channel communicating with the IC material pipe.

Description

technical field [0001] The invention belongs to the technical field of automation equipment, and in particular relates to a feeding mechanism of an IC testing machine. Background technique [0002] IC chip (Integrated Circuit integrated circuit) is to put a large number of microelectronic components (transistors, resistors, capacitors, etc.) It is called an IC chip. The integrated circuit chip must undergo strict testing before leaving the factory. The test items include various performance parameters of the integrated circuit chip, such as current and voltage. People need to screen out the integrated circuit chips whose test results are not within the qualified range, and Classify integrated circuit chips with different test results. There are many packaging methods for IC chips, such as tube packaging types. Figure 8 As shown: the IC chip 2009 is stored in the tubular IC material tube 1001, and the chips in the material tube need to be taken out one by one for testing dur...

AI Technical Summary

Problems solved by technology

[0003] And the feeding mechanism of existing automatic sorting machine, as publication number is the Chinese invention patent of CN106311633A, has announced a kind of integrated circuit chip multi-station serial band marking test sorting device, and its feeding mechanism is arranged by inclination The inclined track in the middle sends the IC chip into the material track. This structure can easily cause the IC chip to fail to slide out, resulting in material jams, etc.

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