Method and system for obtaining internal delay ladder time of memory module

Abstract

The invention discloses a method and a system for acquiring the internal delay step time of a storage module, and belongs to the technical field of communication. The method for acquring the internaldelay step time of the memory module comprises the following steps: respectively delaying the communication interface under at least two different sampling points of the clock source to obtain two boundaries of the communication interface; calculating a delay time of one of the delay steps according to a difference in the number of delay steps between two boundaries of the communication interface.By performing delay processing on the communication interface at different sampling points of the clock source, The two boundaries of the corresponding communication interface under different sampling points are obtained, and the delay time of a single delay step is calculated according to the number of different delay steps under different sampling points, so that the delay time of the control unit is adjusted according to the delay time of the delay step obtained by actual calculation, and the stability of the memory module is improved.

Description

Technical field [0001] The present invention relates to the field of communication technology, and in particular to a method and system for obtaining the internal delay step time of a storage module. Background technique [0002] In the use of the SDIO (Secure Digital Input and Output) interface, as the frequency increases, the problem of SDIO stability is slowly exposed. In practical applications, such as: when the SDIO unit reads the signal to the SOC chip, although the unit ladder time of its internal delay can be obtained according to the specifications of the SOC chip (System-on-a-Chip), it is not necessarily accurate , If the time length of the unit ladder is wrong, it will be misleading in register setting, which will affect the stability of the system in the process of reading signals. However, it is currently impossible to measure the unit ladder of the internal registers of the SOC chip. Summary of the invention [0003] In view of the current problem that the unit lad...

AI Technical Summary

Problems solved by technology

[0003] Aiming at the problem that it is currently impossible to measure the unit ladder of the registers inside the SOC chip, a method and system for obtaining the internal delay ladder time of the storage module are now provided

Images