Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An inspection device

A technology for inspecting devices and inspecting objects, applied to measuring devices, material analysis through optical means, instruments, etc., can solve problems such as complex calculations and processing

Active Publication Date: 2019-01-15
NIDEC TOSOK CORP
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, arithmetic processing for defect inspection sometimes becomes complicated

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An inspection device
  • An inspection device
  • An inspection device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] Next, exemplary embodiments of the inspection device and inspection method of the present invention will be described with reference to the drawings. The inspection device and inspection method of the present invention are devices and methods for performing visual inspection of a surface to be inspected included in an outer peripheral surface of an object to be inspected. Hereinafter, the direction parallel to the thickness direction and axis of the object to be inspected is called "axial direction", and the direction perpendicular to the axial direction is called "radial direction". The direction of is called "circumferential direction" for illustration.

[0022]

[0023] The inspection device 1 of the present embodiment automatically performs an appearance inspection for detecting defects such as dents on the surface of an inspection object 100 having a thickness in the axial direction. More specifically, the inspection object 100 of the present embodiment has a ma...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An inspection device is provided. This inspection device is a device that performs visual inspection of the surface to be inspected included in the inspection object. The inspection device includes anirradiation device, an imaging device, an image storage unit, and a defect detecting unit. The illuminating device moves on an imaginary plane along the surface of the object to be inspected, and illuminates the surface of the object to be inspected toward the object to be inspected. The imaging device includes the inspection surface of the inspection object in the imaging range, receives the light reflected at the inspection surface, and generates a luminance distribution image as an imaging result. The image storage unit stores a plurality of brightness distribution images captured by the imaging device at a plurality of timings in which the positions of the irradiation devices are different and the inspection surface, the imaging device, and the irradiation device are not arranged in astraight line. The defect detecting unit detects a defect on the surface to be inspected based on a plurality of different brightness distribution images.

Description

technical field [0001] The present invention relates to inspection devices. Background technique [0002] Conventionally, there are known inspection devices used to automatically inspect whether or not there is a defect such as a dent on an inspection surface of an inspection object. Such an inspection device is disclosed in, for example, Japanese Patent Application Laid-Open No. 2007-33236. [0003] The surface defect inspection device described in Japanese Patent Application Laid-Open No. 2007-33236 is composed of an illumination unit, an imaging unit, a light source control device, and a defect inspection device. The lighting unit is composed of a plurality of light sources (1a-1f) arranged in sequence on a curved surface. The plurality of imaging units are composed of a plurality of imaging devices (2a to 2f) arranged sequentially on the curved surface. A light source control device (4) selects one light source from among a plurality of light sources in the lighting u...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/88
CPCG01N21/88G01N21/8806G01N21/8851G01N2021/8838G01N2021/8893G01N2201/061G01N2201/102
Inventor 野村昭农宗千典
Owner NIDEC TOSOK CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com