Delay calibration output device and method

Abstract

The present invention provides a delay calibration output device and method. The device comprises a first delay chain unit, a second delay chain unit, a pulse counting unit, a delay processing unit, adelay reference unit and a calibration output unit. The first delay chain unit is configured to transmit detected signals and generate first transmission data; the second delay chain unit is configured to transmit the reference signals and generate second transmission data; the pulse counting unit is configured to obtain counting data of the second delay chain unit; the delay processing unit is configured to obtain actual delay data according to the clock signals and the counting data of the second delay clock unit; the delay reference unit stores first reference delay data and second reference delay data; and the calibration output unit is configured to calibrate and output a delay value corresponding to the first delay chain unit at present according to the first reference delay data, the second reference delay data, the actual delay date, the second transmission data and the first transmission data. The device is low in delay calibration cost and high in delay calibration accuracy.

Description

technical field [0001] The present application relates to the technical field of delay value calibration, and in particular, to a delay calibration output device and method. Background technique [0002] In the existing Time-to-Digital Converter (TDC) based on FPGA (Field-Programmable Gate Array, Field-Programmable Gate Array), the method of measuring the rough time of the measured signal and adding fine time is generally used To obtain the transmission time of the signal under test, the coarse time can be obtained by directly counting the system clock signal, and the fine time is usually obtained by measuring the delay of the signal under test based on the internal delay chain structure of the FPGA. However, since the delay value of the delay chain inside the FPGA will change with the change of temperature and / or voltage, if the measured delay value is not calibrated, measurement deviation will occur. [0003] At present, the mainstream in the industry usually calibrates t...

AI Technical Summary

Problems solved by technology

However, this kind of delay value calibration scheme requires high delay value calibration cost, and the corresponding delay value calibration accuracy and delay value measurement efficiency are not high

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