Electric and thermal combined aging test method and system of large power thyristor
An aging test, thyristor technology, used in the measurement of electricity, measurement of electrical variables, single semiconductor device testing and other directions
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[0136] The present invention proposes a high-power thyristor electrothermal combined aging test method, comprising the following steps:
[0137] (1) Heat accelerated aging test;
[0138] (2) di / dt accelerated aging test;
[0139] (3) Voltage accelerated aging test.
[0140] The step (1) mainly includes the following content: in actual operation, the heating of the thyristor is caused by the large current passing through, and the current waveform of the thyristor in the DC project is as follows: figure 2 shown. In the figure, within a power frequency cycle, the conduction time of the thyristor is 1 / 3 cycle, and the blocking time is 2 / 3 cycle. For this, there are two methods for the thermally accelerated aging test of the thyristor, one is continuous conduction acceleration Aging test methods, one is to increase the current amplitude 1 / 3 cycle conduction heat accelerated aging test method.
[0141] Obviously, if the continuous conduction heat accelerated aging test method i...
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