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Detection method for position of crystal oscillating sheet in evaporation device, evaporation method and related device

A detection method and detection device technology, which are applied in vacuum evaporation plating, sputtering plating, ion implantation plating, etc., can solve the problems of abnormal fluctuation of evaporation rate, reduction of product yield, and deviation of crystal oscillator from the center of detection hole. , to avoid abnormal fluctuations in evaporation rate, improve productivity and product yield

Active Publication Date: 2018-11-27
BOE TECH GRP CO LTD +1
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Problems solved by technology

During the working process of the crystal oscillator, due to the vibration of the crystal oscillator itself or the abnormal rotation of the motor, the crystal oscillator deviates from the center of the detection hole, causing abnormal fluctuations in the evaporation rate from time to time, which not only affects the production capacity, but also reduces the yield of the product in severe cases

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  • Detection method for position of crystal oscillating sheet in evaporation device, evaporation method and related device
  • Detection method for position of crystal oscillating sheet in evaporation device, evaporation method and related device
  • Detection method for position of crystal oscillating sheet in evaporation device, evaporation method and related device

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Embodiment Construction

[0042] In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0043] The shapes and sizes of the components in the drawings do not reflect the real scale, but are only intended to schematically illustrate the content of the present invention.

[0044] The embodiment of the present invention provides a method for detecting the position of the crystal oscillator in the evaporation equipment, such as figure 1 As shown, the following steps may be included:

[0045] S101, using at least two non-parall...

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Abstract

The invention discloses a detection method for the position of a crystal oscillating sheet in an evaporation device, an evaporation method and a related device. At least two metal electrode plates unparallel to each other and the crystal oscillating sheet located at the center of a detection hole form a capacitor; when the crystal oscillating sheet works, a capacitance value of the capacitor is detected in real time; if the position of the crystal oscillating sheet relative to the detection hole is abnormal can be confirmed according to the detected capacitance value of the capacitor; an abnormal crystal oscillating sheet is replaced if the position is abnormal. In the process of material evaporation, the position information of the crystal oscillating sheet can be monitored in real time in a manner of detecting the capacitance value of the capacitor formed by the crystal oscillating sheet and the metal electrode plates, so that the crystal oscillating sheet on abnormal position can bereplaced in time, the abnormal fluctuation of evaporation rate caused by the crystal oscillating sheet deviated from the center of the detection hole can be avoided and the productivity and the product yield can be promoted.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a method for detecting the position of a crystal oscillator in an evaporation device, an evaporation method and a related device. Background technique [0002] In the production line of organic electroluminescent display panels (OLED, Organic Light-Emitting Diode), the crystal oscillator in the evaporation equipment is used to monitor the evaporation rate in real time, so as to ensure that the film thickness of each organic layer is controlled within the error range (Spec) Inside. During the working process of the crystal oscillator, due to the vibration of the crystal oscillator itself or the abnormal rotation of the motor, the crystal oscillator deviates from the center of the detection hole, causing abnormal fluctuations in the evaporation rate, which not only affects the production capacity, but also reduces the product yield in severe cases. [0003] Therefore, how to moni...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/54C23C14/24
CPCC23C14/24C23C14/546
Inventor 白玉庭张超
Owner BOE TECH GRP CO LTD
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