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An integrated atomic force microscope probe preservation, transportation and cleaning device

An atomic force microscope and cleaning device technology, applied in measurement devices, scanning probe technology, scanning probe microscopy, etc., can solve the problems of decreased measurement accuracy, cantilever protection, probe damage, etc., to improve safety and convenience. The effect of transportation and storage, convenient installation

Active Publication Date: 2021-01-01
ZHONGBEI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although this method uses low-frequency cleaning, there is no special protection for the cantilever, and it will still cause damage to the probe during cleaning, resulting in a decrease in its measurement accuracy

Method used

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  • An integrated atomic force microscope probe preservation, transportation and cleaning device
  • An integrated atomic force microscope probe preservation, transportation and cleaning device
  • An integrated atomic force microscope probe preservation, transportation and cleaning device

Examples

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Embodiment Construction

[0032] Below in conjunction with accompanying drawing and specific embodiment, the present invention will be described in further detail, but the scope of protection of the present invention is not limited to the following examples, all technical schemes obtained by adopting equivalent replacement or equivalent transformation forms are all within the scope of protection of the present invention .

[0033] as attached figure 1 As shown, it is a schematic diagram of batch installation of an integrated atomic force microscope probe storage, transportation and cleaning device and its use method of the present invention. By arranging the probe installation units 1 in rows and columns and loading them into the assembly box 2-1 and then sealing the assembly cover 2-2, batch storage and transportation can be realized. For example, the assembly box 2-1 can store 5x10 probe installation units.

[0034] as attached figure 2 To attach Figure 5 Probe mounting unit 1 is shown. The pro...

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Abstract

The invention belongs to the field of storage and cleaning of atomic force microscope probes and in particular relates to an integrated atomic force microscope probe storing, transporting and cleaningdevice. The integrated atomic force microscope probe storing, transporting and cleaning device is composed of probe mounting units, a final assembly box and a cleaning module. Probes are mounted andfixed in slots of gel fixture blocks by means of gel locking strips in a magnetic adsorption manner, and the gel fixture blocks fix the probes and are mounted in unit frames to form the probe mountingunits. The probe mounting units are parallelly placed in the final assembly box in lines and rows for convenience of storing and transporting the probes. The probes are fixed to the gel fixture blocks through the gel locking strips and the gel locking strips lock two sides of probe pedestals. The probes can be mounted through the easily clamped gel clamping strips, so that the probability that the probes which are mounted are damaged is avoided. The probe mounting units can be placed in the center of the cleaning module, the probes are cleaned ultrasonically, and protecting slots are formed in the gel locking blocks to protect cantilevers of the probes, so that the cleaning quality is improved and the safety is ensured. The integrated atomic force microscope probe storing, transporting and cleaning device has the characteristics of being high in safety, high in universality and convenient and efficient.

Description

technical field [0001] The invention belongs to the field of preservation and cleaning of atomic force microscope probes, and specifically relates to an integrated atomic force microscope probe preservation, transportation and cleaning device. Background technique [0002] AFM has been widely used due to its advantages of easy operation, simple sample preparation, and high resolution, and has become a necessary precision instrument in the fields of nanoscience and micro-nano processing. Since the tip of the probe used in the atomic force microscope is only a few atoms, and its cantilever is only a few microns, it is easy to be damaged during storage and transportation, and each probe is about tens of dollars. Reasonable storage and transportation methods need further research. Complete. As described in the EP2237051 patent, a liquid-tight container for storing and transporting atomic force microscope probes is provided with convex grooves for fixing the probes, and the conv...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B08B3/12B65D25/10
CPCB08B3/12B65D25/10G01Q70/00
Inventor 马宗敏刘俊张晓明唐军吴斌魏久焱武兴盛
Owner ZHONGBEI UNIV
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