An integrated atomic force microscope probe preservation, transportation and cleaning device
An atomic force microscope and cleaning device technology, applied in measurement devices, scanning probe technology, scanning probe microscopy, etc., can solve the problems of decreased measurement accuracy, cantilever protection, probe damage, etc., to improve safety and convenience. The effect of transportation and storage, convenient installation
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[0032] Below in conjunction with accompanying drawing and specific embodiment, the present invention will be described in further detail, but the scope of protection of the present invention is not limited to the following examples, all technical schemes obtained by adopting equivalent replacement or equivalent transformation forms are all within the scope of protection of the present invention .
[0033] as attached figure 1 As shown, it is a schematic diagram of batch installation of an integrated atomic force microscope probe storage, transportation and cleaning device and its use method of the present invention. By arranging the probe installation units 1 in rows and columns and loading them into the assembly box 2-1 and then sealing the assembly cover 2-2, batch storage and transportation can be realized. For example, the assembly box 2-1 can store 5x10 probe installation units.
[0034] as attached figure 2 To attach Figure 5 Probe mounting unit 1 is shown. The pro...
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