Double-loop fault ranging method and apparatus based on distributed parameter model
A distributed parameter model, fault location technology, applied in the measurement device, fault location, measurement power and other directions
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0061] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.
[0062] As the first aspect of the present invention, there is provided a double-circuit line fault location method based on a distributed parameter model, wherein the double-circuit lines I and II are connected between the plant stations M and N, and the line between M and N The length distance is set as L, and the distance between the fault point and the M side is set as d, such as figure 1 As shown, the described double-circuit fault location method based on the distributed parameter model includes:
[0063] S110, collecting the busbar voltage U on both sides of the faulty line M and U N And collect the current data I of the line protection device correspon...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com