Circuit for accessing chip test mode and control method of circuit

Abstract

The invention relates to a circuit for accessing a chip test mode and a control method of the circuit. The circuit comprises a power-on reset logic module and a counting decoding logic module, an existing chip pin is reused, the counting decoding logic module based on one-hot encoding counting is designed to access and switch various test modes, pin sources of a chip are saved, test efficiency ofthe chip is improved, chip test is in a scan chain test mode when clock jump is driven, and the test coverage rate of a scan chain can be increased.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a circuit for entering a chip testing mode and a control method thereof. Background technique [0002] In modern chip design, the success of a chip is closely related to the testability of the chip. At the same time, chip testing is also an important part of chip cost. A good chip testing method can greatly save the cost of chip testing. On the contrary, if the chip testing cost is high, it will directly increase the cost of the chip, which is not conducive to the chip participating in the fierce market competition. Therefore, many chips have made detailed plans for chip testing at the beginning of the project. [0003] In the current technology, many chip test circuits require a special chip configuration or allow the chip to be tested to set aside special pins to complete the design of the chip test mode. The operation of these test methods is relatively complicated, there is a l...

AI Technical Summary

Problems solved by technology

The operation of these test methods is relatively complicated, and there is a large waste of pin resources, which also affects the coverage of the test.

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