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Multi-element acceleration factor calculation method of electronic equipment

A technology of acceleration factor and electronic equipment, which is applied in the field of equipment acceleration test, can solve the problem that it is difficult to obtain accurate and effective acceleration factors for electronic equipment, and achieve the effect of overcoming failure differences and accurate acceleration tests

Active Publication Date: 2018-08-14
CASIC DEFENSE TECH RES & TEST CENT
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Problems solved by technology

[0004] Therefore, in the process of implementing the present application, the inventors found that the prior art has at least the following problems: the current accelerated life test is difficult to obtain accurate and effective acceleration factors for electronic devices with complex structures and life-influencing factors

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  • Multi-element acceleration factor calculation method of electronic equipment

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Embodiment Construction

[0066] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0067] It should be noted that all expressions using "first", "second", "third" and "fourth" in the embodiments of the present invention are to distinguish between two entities with the same name but different parameters or different parameters It can be seen that "first", "second", "third" and "fourth" are only for the convenience of expression, and should not be construed as limiting the embodiments of the present invention, and the following embodiments will not describe them one by one.

[0068] This application aims at the problem that it is difficult to accurately calculate the acceleration factor for the complete equipment such as the complete electronic equipment in the current acceleration test, and proposes a met...

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Abstract

The invention discloses a multi-element acceleration factor calculation method of electronic equipment. The method includes: respectively constructing single-point stress damage models for different elements influencing life of the electronic equipment, and calculating and obtaining corresponding acceleration factors; constructing a competition failure-based failure model of the entire electronicequipment on the basis of the characteristics of the electronic equipment and the single-point stress damage models; and calculating and obtaining acceleration factors of the electronic equipment on the basis of the constructed fault model of competition failure according to a statistical equivalence principle. According to the method, for the current electronic equipment of which an equipment structure and failure modes are complicated, failure mechanisms and failure forms under various stress conditions of temperature, humidity, vibration, electrical stress, combinations thereof and the likeare analyzed, a corresponding stress failure model is constructed, and thus the acceleration factors of the electronic equipment can be obtained according to the different elements, the fault model and a corresponding system life model. The method is completely suitable for accelerated testing of the entire-machine equipment, and then enables accelerated testing of the electronic equipment to bemore accurate and reliable.

Description

technical field [0001] The invention relates to the technical field related to equipment acceleration tests, in particular to a calculation method for multi-factor acceleration factors of electronic equipment. Background technique [0002] The development of modern science and technology and the improvement of industrial level have accelerated the improvement speed of materials, components and process quality and reliability of electronic equipment, and also put forward new requirements for reliability test technology. Therefore, how to evaluate the reliability of high-reliability and long-life products is an important problem to be solved in the field of reliability engineering. For products with mean time between failures (MTBF, Mean Time Between Failure) as long as thousands or even tens of thousands of hours, it is unaffordable to conduct traditional reliability tests in terms of cycle and cost. Therefore, in order to explore more efficient methods to obtain high-reliab...

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/20G06F2119/04
Inventor 张生鹏李宏民
Owner CASIC DEFENSE TECH RES & TEST CENT
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