Circuit fault diagnosis method based on random forest algorithm

Abstract

The invention discloses a circuit fault diagnosis method based on a random forest algorithm, which comprises the steps that all fault types of a circuit under test, the external output state of each fault type and the corresponding fault location are analyzed; the training for multiple decision-making trees is completed, and the multiple decision-making trees form a random forest model; and the current fault state of the circuit under test is collected, the fault state is inputted into the random forest model, and the random forest model finally outputs the current fault location of the circuit under test. According to the invention, firstly all fault types, the external output state of each fault type and the corresponding fault location of the circuit under test are analyzed, then the training for the random forest model is completed, and the fault location of a circuit can be obtained by only inputting the fault state of the circuit into the random forest model in the process of performing fault diagnosis on the circuit in the future, so that the diagnosis time is saved to the maximum extent, and work efficiency is improved. The circuit fault diagnosis method is used for performing diagnosis on a circuit fault condition.

Description

technical field [0001] The invention relates to the technical field of circuit fault diagnosis. Background technique [0002] With the rapid development of modern industry and science and technology, electronic technology is constantly innovating, and most of the products necessary for daily life are equipped with circuit boards. Now the number of electronic components contained in the structure of electronic circuits has risen sharply. When an electronic circuit fails, the existence of a high number of electronic components makes the cause of the circuit failure complicated. It is very important to quickly analyze the fault location of the circuit, and the current situation requires professionals in related fields to use multimeters, oscilloscopes and other equipment to detect and analyze the circuit to determine the cause of the fault, which is time-consuming and inefficient. Contents of the invention [0003] The technical problem to be solved by the present invention ...

AI Technical Summary

Problems solved by technology

Now the number of electronic components contained in the structure of electronic circuits has risen sharply. When an electronic circuit fails, the existence of a high number of electronic components makes the cause of the circuit failure complicated. It is very important to quickly analyze the fault location of the circuit, and the existing situation requires professionals in related fields to use multimeters, oscilloscopes and other equipment to detect and analyze the circuit to determine the cause of the fault, which is time-consuming and inefficient

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