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Fast analysis method for influences imposed on target infrared detectability by environmental and time period factors

A rapid analysis and target technology, applied in image analysis, character and pattern recognition, image data processing, etc., can solve problems such as limitations, a large amount of manual investment, and tediousness, and achieve high accuracy, strong operability, and fast calculation Effect

Active Publication Date: 2018-06-29
BEIJING RES INST OF MECHANICAL & ELECTRICAL TECH
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AI Technical Summary

Problems solved by technology

The traditional analysis of the impact of environment and time factors on the infrared detectability of targets is based on accurate infrared modeling & imaging simulation of the target scene. It is extremely cumbersome and requires a lot of manual input, and the manually specified material classification results are often very coarse-grained, resulting in a large difference from the infrared material characteristics of the real target scene, which affects the subsequent detectability analysis; secondly, in order to model fine material targets Predicting the infrared imaging characteristics of a scene requires fine-grained environment and period traversal, but it is difficult to guarantee the ambient temperature and ambient humidity data corresponding to each specific simulation moment, and these data are crucial to the calculation of the infrared temperature field of the target scene
The above two factors limit the application of traditional infrared modeling and simulation technology in target infrared detectability analysis

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  • Fast analysis method for influences imposed on target infrared detectability by environmental and time period factors

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Embodiment Construction

[0014] Embodiments of the present invention will be described below with reference to the drawings. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not relevant to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity.

[0015] refer to figure 1 , the present embodiment provides a rapid analysis method for the impact of environmental and time factors on the infrared detectability of the target, including:

[0016] Step S101, acquiring a target / background scene visible light texture image, and processing the visible light texture image to obtain a material fine-grained designation file;

[0017] Step S102, obtaining the historical weather data of the location of ...

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Abstract

The invention provides a fast analysis method for influences imposed on the target infrared detectability by environmental and time period factors. The fast analysis method comprises the steps of modulating a specified result of a coarse-grained scene material segmentation by using a visible light texture image, and automatically calculating fine infrared material data of a target scene; automatically fitting and calculating meteorological parameters at different time periods of the day according to meteorological average values such as the historical average temperature and the average humidity obtained through meteorological investigation; calculating a total radiation intensity contribution value of each modeling surface element of the target and the background on an imaging focal planeof an infrared camera by using plane projection accumulation; introducing an asymmetrical distance energy attenuation model, and calculating the radiation intensity of the target and the background in front of a lens; obtaining the black body equivalent temperature difference between the target and the background in front of the lens by using Planck formula conversion, and further calculating animaging signal-to-noise ratio of the target; and comparing the calculated signal-to-noise ratio with the minimum detectable signal-to-noise ratio threshold of a detector to obtain a final target detectability result.

Description

technical field [0001] The invention relates to a method for quickly analyzing the influence of environment and time period factors on the infrared detectability of a target. Background technique [0002] Generally speaking, the greater the contrast between the target and the background in the infrared real-time image, the more information in the target area, and the higher the detectability of the target. The infrared image reflects the infrared radiation information of the object. According to the Planck formula, in the infrared band, the content of the image is determined by the infrared emissivity of the object in the scene and its temperature. The infrared emissivity of an object is an inherent object property of the object. Under the same lighting, temperature and shooting angle conditions, the gray value of the object of the same material on the infrared image is almost the same. From the perspective of information theory, there is no Any amount of information, and o...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06K9/00G06K9/62G06T17/20
CPCG06T7/0002G06T17/20G06T2207/10048G06V20/00G06V2201/07G06F18/24
Inventor 刘东红初宁杨晨光刘清华
Owner BEIJING RES INST OF MECHANICAL & ELECTRICAL TECH
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