Fast analysis method for influences imposed on target infrared detectability by environmental and time period factors
A rapid analysis and target technology, applied in image analysis, character and pattern recognition, image data processing, etc., can solve problems such as limitations, a large amount of manual investment, and tediousness, and achieve high accuracy, strong operability, and fast calculation Effect
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[0014] Embodiments of the present invention will be described below with reference to the drawings. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not relevant to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity.
[0015] refer to figure 1 , the present embodiment provides a rapid analysis method for the impact of environmental and time factors on the infrared detectability of the target, including:
[0016] Step S101, acquiring a target / background scene visible light texture image, and processing the visible light texture image to obtain a material fine-grained designation file;
[0017] Step S102, obtaining the historical weather data of the location of ...
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