Guided-wave-based probability imaging method for damages
An imaging method and probabilistic technology, which are applied in the processing of the detected response signals, the analysis of solids using sonic/ultrasonic/infrasonic waves, and the material analysis using sonic/ultrasonic/infrasonic waves. , The effect of high damage location accuracy and clear image
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0039] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.
[0040] refer to figure 1 , the existing guided wave-based structural damage monitoring is basically composed of a waveform generator 1, a power amplifier 2, a piezoelectric array 3, a structure to be tested 4, a charge amplifier 5, and a data acquisition and processing system 6. The waveform generator 1 is connected with the power amplifier 2 through a wire; the power amplifier 2 is connected with the exciter in the monitoring path formed by the piezoelectric sheet array 3 through a wire; the sensor in the monitoring path is connected with the charge amplifier 5 through a wire; the charge amplifier 5 is connected through the The wire is connected with the data acquisition and processing system. During the monitoring process, the system generates guided waves in the structure to be tested 4, and collects guided waves propagating in the monit...
PUM
![No PUM](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com