A dichotomous test method for voltage sag withstand capability
A technology of voltage sag and test method, applied in the direction of testing dielectric strength, etc., can solve the problems of poor accuracy and low workload, and achieve the effect of accurate tolerance, accurate test and guaranteed accuracy
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[0050] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments. This embodiment follows part of the test plan in the IEEE1668 standard, such as its maximum test time (2s) and amplitude change (0-85%). After a brief initial test, the minimum time was set to 0s, in order to include some particularly sensitive devices.
[0051] In this embodiment, an amplitude step size of 2% is set, because if the step size is too large, the test accuracy will be reduced, and if the step size is too small, the workload will be greatly increased. And keep the amplitude of the voltage sag unchanged, and determine the time point of the voltage sag test based on the dichotomy method. First, test the minimum and maximum values of the voltage sag duration. The time is the median of these two times, and the duration of the next test is the median of the duration of the device tripping situation at this median time and the...
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