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Software defect prediction method for support vector machine based on neighborhood preserving embedding algorithm

A technology of software defect prediction and support vector machine, applied in computer components, software testing/debugging, computing, etc., can solve problems such as software measurement data redundancy, overcome singular problems, improve accuracy and recall rate, Highly Accurate Effects

Active Publication Date: 2018-04-24
BEIJING INSTITUTE OF TECHNOLOGYGY
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Problems solved by technology

[0012] The present invention proposes a software defect prediction method based on the support vector machine based on the neighborhood embedding protection algorithm, which is used to solve the problem of software measurement data redundancy, so that the final defect distribution prediction result has a higher accuracy than other traditional prediction technologies Accuracy

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  • Software defect prediction method for support vector machine based on neighborhood preserving embedding algorithm
  • Software defect prediction method for support vector machine based on neighborhood preserving embedding algorithm
  • Software defect prediction method for support vector machine based on neighborhood preserving embedding algorithm

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Embodiment Construction

[0022] A kind of software defect prediction method based on neighborhood embedding protection algorithm support vector machine of the present invention, specific embodiment comprises the following steps:

[0023] (1) Obtain the prediction data set:

[0024] The experimental data used in this embodiment comes from the MDP provided by NASA, which is widely used in software defect prediction research. It contains 13 datasets, as shown in Table 1. Each data set contains multiple samples, each sample corresponds to a software module, and each software module consists of several static code attributes, and identifies the number of attributes in the software module. Static code attributes identify each piece of data, including code lines (Loc), Halstead attributes and McCabe attributes. In this embodiment, CM1, KC3, MW1 and PC1 in NASA are selected as prediction data sets.

[0025] Table 1: 13 data sets provided by NASA

[0026]

[0027] (2) Select the training set X from the ...

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Abstract

The invention provides a software defect prediction method for a support vector machine based on a neighborhood preserving embedding algorithm. The method is used for solving the problem of data redundancy of software metrics. The method comprises the steps that a training set X1 and a testing set X2 are selected from a software defect prediction data set; the NPE algorithm is adopted for conducting dimension reduction on the training set X1 and the testing set X2; a training set Y1 after dimension reduction is used as a training input set, the support vector machine (SVM) is used for training, and a trained defect prediction model is obtained; a testing set Y2 after dimension reduction is used as a testing input set, the trained defect prediction model is used for prediction, a predictionresult is compared with an actual result, and if the prediction result meets a stopping condition, the software defect prediction model at this time is an optimum software defect prediction model; ifnot, SVM training is executed again, and optimization is conducted.

Description

technical field [0001] The invention relates to a software defect prediction method based on a neighborhood embedding protection algorithm support vector machine, belonging to the technical field of software prediction. Background technique [0002] Software defects: IEEE729-1983 has a standard definition of defects. From the internal point of view of the product, defects are various problems such as errors and defects in the process of software product development or maintenance; from the external point of view of the product, defects are the software system and its original The failure or violation of a certain function that needs to be realized. [0003] Static prediction: Static software defect prediction technology is an earlier prediction technology that is currently researched and applied most. It is mainly based on extracting software-related measurement information to establish a corresponding prediction model for defect prediction. [0004] Prediction model based ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06K9/62
CPCG06F11/3604G06F18/21322G06F18/2411
Inventor 单纯胡昌振熊雯洁位华雷敏
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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