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Tester for interior quality of apples

An internal quality, measuring instrument technology, applied in the direction of instruments, measuring devices, scientific instruments, etc., can solve the problem of not being able to judge the quality of apples

Inactive Publication Date: 2018-03-27
NORTHWEST A & F UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The Chinese Patent Office published a patent application (CN104062248A) on September 24, 2014, disclosing a method for detecting mechanical damage to apples, which can determine whether the apple is damaged, but cannot judge the quality of the apple

Method used

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  • Tester for interior quality of apples
  • Tester for interior quality of apples

Examples

Experimental program
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Effect test

Embodiment Construction

[0015] Below, combined with figure 1 , attached figure 2 A specific implementation is given.

[0016] The upper electrode plate 4 is initially in a raised state. After the apple 5 puts down the electrode plate 6, the control circuit can detect the corresponding signal through the upper pressure sensor 7 installed thereon, and control the upper electrode plate 4 to move downward. When the upper electrode plate 4 touches the apple 5, the control circuit can detect the corresponding signal by the lower pressure sensor 8 installed below it, and the upper electrode plate 4 is controlled to stop moving, and the height measuring device is controlled to measure the height or diameter of the apple 5, and notify The LCR data acquisition instrument 2 starts to measure the electrical characteristic parameters of the Apple 5.

[0017] After the LCR data acquisition instrument 2 receives the notification of starting the measurement, the single-chip microcomputer 11 controls the filter 1...

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Abstract

An apple internal quality measuring instrument is composed of a measuring frame, an LCR data acquisition instrument and a computer, which can automatically measure the electrical characteristic parameters of apples at multiple frequencies, and determine the internal quality or grade the apples according to these electrical characteristic parameters. The measuring frame is equipped with upper pressure sensor, lower pressure sensor, height measuring device and control circuit, which can control the automatic lowering, stopping and lifting of the upper electrode plate, so as to realize the automatic determination of apple quality. The height measuring device can measure the height or diameter of the apple.

Description

technical field [0001] The invention relates to an apple internal quality measuring instrument, which belongs to the field of fruit quality measuring. Background technique [0002] China Patent Office published a patent application (CN104062248A) on September 24, 2014, disclosing a method for detecting mechanical damage of apples, which can judge whether the apples are damaged, but cannot judge the quality of the apples. [0003] If an apple is placed between two electrode plates, and electric fields of different frequencies are applied to the electrode plates, the dielectric properties of the apples can be measured, and the dielectric properties of apples with different qualities are also different. The object of the present invention is to provide an apple internal quality measuring instrument based on dielectric properties. Contents of the invention [0004] The apple internal quality measuring instrument among the present invention is made up of measuring frame, LCR d...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/22
CPCG01N27/221
Inventor 来智勇胡志晨徐杨杨斌
Owner NORTHWEST A & F UNIV
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