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Novel control automation type electrostatic protection test system and electrostatic protection test method for power devices

A technology for controlling automation and power devices. It is applied in the direction of single semiconductor device testing, electrical measuring instrument components, and instruments. It can solve problems that cannot meet the requirements of electrostatic reliability research and electrostatic protection design, and achieve easy manufacturing and debugging. Stable Good performance and flexible use

Active Publication Date: 2018-02-23
常州鼎先电子有限公司
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  • Application Information

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Problems solved by technology

However, this cannot meet the needs of electrostatic reliability research and electrostatic protection design

Method used

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  • Novel control automation type electrostatic protection test system and electrostatic protection test method for power devices
  • Novel control automation type electrostatic protection test system and electrostatic protection test method for power devices
  • Novel control automation type electrostatic protection test system and electrostatic protection test method for power devices

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Embodiment Construction

[0033] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0034] The invention provides a switch device and a switch control method of an electrostatic testing system.

[0035] The switching device mainly utilizes the ability of the semiconductor power device to conduct electrical path on-off under the control of electrical signals. Compared with electromechanical switching devices such as high-speed / ultra-high-speed relays, semiconductor power devices as switches for test systems have the characteristics of low price, good product consistency, fixed input and output impedance, long service life and a wide range of products.

[0036] In the present invention, a part of the semiconductor power devices 11, 12, 13, 14 are respectively placed between the power supply 80 and the charging transmission lines 31, 32, 33, 34, and their control signals are connected to the microprocessor 90; the other part of the semiconducto...

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Abstract

The invention discloses a novel control automation type electrostatic protection test system and an electrostatic protection test method for power devices. According to the switch control device of the system, a plurality of semiconductor power devices are respectively arranged between a power supply and a charging transmission line, and the controls signals of the power devices are connected intoa microprocessor. Another plurality of semiconductor power devices are respectively arranged between the charging transmission line and a pulse propagation transmission line, and the controls signalsof the power devices are also connected into the microprocessor. According to the invention, the semiconductor power devices are adopted as the switch device of the system. In combination with a plurality of power device switch devices, a proper charging transmission line and a combination thereof are selected. Therefore, a pulse testing system with various pulse widths can be realized. Accordingto the system, the semiconductor power devices are used as the switch device to realize the multi-path control, so that the advantages of low cost, easy manufacture and debug, convenient maintenance,good stability, flexible usage and the like are realized. In combination with an automatic test system composed of a micro-controller, the system can be applied to the automatic testing of electrostatic protection and the like, and can completely meet the requirements of the multi-pulse width test.

Description

technical field [0001] The invention relates to the field of electrostatic reliability testing in semiconductor reliability testing, in particular to a novel automatic system and method for measuring the electrostatic protection characteristics of semiconductor components. Background technique [0002] Electrostatic protection has always been a key research direction in semiconductor reliability. With the continuous advancement of semiconductor manufacturing processes, the risk of damage to integrated circuits caused by electrostatic discharge has received increasing attention. In the study of electrostatic reliability and electrostatic protection design, how to measure the electrostatic characteristics of the device under test is particularly important. [0003] In order to meet the needs of electrostatic reliability research, electrostatic protection design and evaluation of electrostatic protection levels, all electrostatic protection phenomena are mainly divided into hum...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01R31/00G01R1/28G01R1/04G01R1/24
Inventor 姜一波董良威翟明静鲍静益葛云飞王玥汤洪波
Owner 常州鼎先电子有限公司
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