Optical vector analysis method and apparatus based on chirping intensity modulation

Abstract

The invention discloses an optical vector analysis method based on chirping intensity modulation. The method comprises the following steps: using a chirping intensity modulation light double-sidebandsignal as detection light to irradiate a to-be-detected optical device, and converting an optical signal into an electric signal by photoelectric detection; changing the phase difference between the double-sideband signal and the optical carriers to obtain detection optical signals of different chirping intensity modulation states, then establishing an equation set by using the relationship between the amplitude information of the electric signals obtained by the detection optical signals of different chirping intensity modulation states and the detection optical signals, and solving to obtainamplitude response of the to-be-detected optical device. The invention further discloses an optical vector analysis apparatus based on chirping intensity modulation. By adoption of the optical vectoranalysis method and apparatus, complex and relatively narrowband single side band modulation or carrier frequency shift is avoided while realizing high precision measurement of the amplitude responseof the optical device, the measurement range is doubled, the measurement errors caused by vestigial sideband are eliminated, the filtering mechanism in the system is eliminated, and the cost and thecomplexity of the system are greatly reduced.

Description

technical field [0001] The invention relates to an optical vector analysis method, in particular to an optical vector analysis method and device based on chirp intensity modulation. Background technique [0002] Spectral response is an important parameter to reveal the characteristics, functions and potential applications of optical materials, devices and systems. Its precise measurement is a fundamental problem in many disciplines such as optoelectronics, optics, material science, metrology, life science and astronomy. At present, the spectral response measurement technology of optical devices is still in its infancy, that is, low-resolution scalar measurement technology is the main technology, and very few low-resolution optical vector analysis technology is supplemented. However, the development, detection and application of high-precision optical devices and core photonic integrated chips, the rapid development of photonic technology, and the continuous innovation of fro...

AI Technical Summary

Problems solved by technology

However, the optical vector analysis technology of optical single sideband modulation has the problems of limited sideband suppression ratio, low scanning bandwidth, residual sideband will introduce measurement error, and small dynamic range.

In addition, the measurement technique of optical unilateral modulation also needs to use an optical filter to filter out one sideband of the electro-optic modulation double-sided band signal, so the system is optically wavelength dependent and complex and expensive, which limits its application range

For optical vector analysis based on asymmetrical optical double-sideband modulation [References: Qing T, Li S, Xue M, Li W, Zhu N and Pan S and Zhao Y. Optical vector analysis based on asymmetrical optical double-sideband modulation using a dual-drive dual-parallel Mach-Zehnder modulator[J].OpticsExpress,2017,25(5):4665-4671.], the system needs to introduce additional signal sources and high-power photoelectric modulation devices to make the system complex, and the The structure requires the use of two photoelectric detectors and two amplitude-phase receivers, which greatly increases the system cost

Therefore, although the optical vector analysis technology based on the existing broadband electrical modulation can perform high-resolution optical vector analysis on optical devices, it cannot simultaneously solve the problems of limited sideband suppression ratio, wavelength correlation, narrow measurement range, complex operation, and complex system structure. , high cost and other key issues prevent it from being widely used as a general-purpose high-resolution optical vector analysis technology

Images