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A sample table of a neutron diffraction stress spectrometer

A sample stage and stress spectrum technology, which is applied in material analysis using radiation diffraction, material analysis using wave/particle radiation, instruments, etc., can solve problems such as low motion accuracy, insufficient carrying capacity, and small sample motion stroke

Inactive Publication Date: 2017-12-19
CENT SOUTH UNIV
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The present invention provides a neutron diffraction stress spectrometer sample stage that overcomes the above-mentioned problems or at least partially solves the above-mentioned problems, and solves the problem of small motion stroke, low motion accuracy, and load-carrying capacity of samples in the neutron spectrometer sample stage in the prior art. Insufficient problem

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  • A sample table of a neutron diffraction stress spectrometer
  • A sample table of a neutron diffraction stress spectrometer
  • A sample table of a neutron diffraction stress spectrometer

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Embodiment Construction

[0039] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0040] Figure 1 to Figure 7 A sample stage of a neutron diffraction stress spectrometer is shown, and its performance directly determines the advancement of the spectrometer. Such as Figure 1 to Figure 3 As shown, the neutron diffraction stress spectrometer sample stage includes a sample mounting plate 1, which is used to install the test piece and the sample environment loading device, and also includes a horizontal motion system 2 that controls the horizontal movement of the sample mounting plate 1, The vertical lifting system 3 that controls the vertical movement of the sample mounting plate 1, and the rotary motion system 4 that controls the rotation of the sample ...

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Abstract

A sample table of a neutron diffraction stress spectrometer is provided. The sample table includes a sample mounting plate, a horizontal movement system controlling horizontal movement of the sample mounting plate, a vertical lifting and descending system controlling vertical movement of the sample mounting plate, and a rotation movement system controlling rotation of the sample mounting plate, a neutron diffraction stress spectrometer detector and a capturer. The sample mounting plate is disposed on the horizontal movement system. The lower part of the horizontal movement system is connected to the vertical lifting and descending system. The vertical lifting and descending system is connected to the rotation movement system. The bottom of the rotation movement system is connected to a floating supporting system. The rotation movement system includes a sample table autorotation part, a sample table supporting mechanism and a swing and connecting part. The sample table autorotation part is used for controlling the sample mounting plate to rotate around the center axis. The swing and connecting part is mounted to the sample table supporting mechanism through a circular-arc guide rail, and is used for connecting the detector and the capturer, and moves along the circular-arc guide rail.

Description

technical field [0001] The invention relates to the technical field of in-situ measurement of material structure and performance, and more specifically relates to a sample stage of a neutron diffraction stress spectrometer. Background technique [0002] The application of neutron scattering technology began in 1946. Researcher Shull of the Oak Ridge National Laboratory in the United States used a reactor-based neutron source to carry out neutron diffraction experiments for the first time, aiming to analyze the microscopic static structure inside the material. The neutron diffraction analysis technology is the same as The X-ray analysis method is similar, and the strain is calculated according to the displacement of the diffraction peak, and then converted into a stress result. Compared with the latter, neutrons have obvious advantages in penetration depth and distinguishing adjacent elements. It is generally believed in the industry that neutron diffraction analysis technolo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20
CPCG01N23/20025
Inventor 吴运新龚海钟掘李杨冯小磊彭富霞张宇李永勃聂林
Owner CENT SOUTH UNIV
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