A sample table of a neutron diffraction stress spectrometer
A sample stage and stress spectrum technology, which is applied in material analysis using radiation diffraction, material analysis using wave/particle radiation, instruments, etc., can solve problems such as low motion accuracy, insufficient carrying capacity, and small sample motion stroke
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0039] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.
[0040] Figure 1 to Figure 7 A sample stage of a neutron diffraction stress spectrometer is shown, and its performance directly determines the advancement of the spectrometer. Such as Figure 1 to Figure 3 As shown, the neutron diffraction stress spectrometer sample stage includes a sample mounting plate 1, which is used to install the test piece and the sample environment loading device, and also includes a horizontal motion system 2 that controls the horizontal movement of the sample mounting plate 1, The vertical lifting system 3 that controls the vertical movement of the sample mounting plate 1, and the rotary motion system 4 that controls the rotation of the sample ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com