Switch matrix and self-check method thereof

Abstract

The invention provides a switch matrix comprising a line input signal set, a column input signal set, a relay matrix array, a column relay array, a line relay array, a current source module, a MCU module, a communication module, an ADC acquisition module, and a display / upper camera stand interface module; the display / upper camera stand interface module, the ADC acquisition module and the communication module are respectively connected with the MCU module; the ADC acquisition module, the communication module, the column relay array and the line relay array are respectively connected with the current source module; each relay of the column relay array is correspondingly connected with the line input signal set and the relay matrix array one by one; each relay of the line relay array is correspondingly connected with the column input signal set and the relay matrix array one by one. The invention also provides a switch matrix self-check method so as to fast check the switch matrix problems.

Description

technical field [0001] The invention relates to a switch matrix and a self-checking method thereof. Background technique [0002] In the current laboratory test, the object under test is often changed, and the wiring of the fixture is very time-consuming and labor-intensive, so the laboratory equipment is connected using a switch matrix. However, the existing switch matrix is ​​complicated, and it is not easy to debug in production, and it is not easy to troubleshoot abnormalities after problems occur. When a component of the switch matrix fails, the faulty component cannot be detected, and then the problem point cannot be repaired and the component replaced. Instead, the entire switch matrix can only be replaced, resulting in waste and high replacement costs. In addition, the life status of the relays of the switch matrix cannot be judged after repeated use, and it is impossible to predict whether the relays need to be replaced, and failure warnings caused by life problems...

AI Technical Summary

Problems solved by technology

[0002] In the current laboratory test, the object under test is often changed, and the wiring of the fixture is very time-consuming and labor-intensive, so the laboratory equipment connection uses a switch matrix

However, the existing switch matrix is ​​complicated, it is not easy to debug in production, and it is not easy to troubleshoot abnormalities after problems occur.

When a component of the switch matrix fails, the problematic component cannot be detected, and then the problem cannot be repaired and replaced. Instead, the entire switch matrix can only be replaced, resulting in waste and high replacement costs.

In addition, the life status of the relays of the switch matrix cannot be judged after repeated use, and it is impossible to predict whether the relay needs to be replaced, and it is impossible to provide early warning of failures caused by life problems, which will cause delays in the progress of the experiment and delay time.

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