Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Trace element detection device based on plasma surface wave excitation

A plasma and trace element technology, used in measuring devices, material analysis by electromagnetic means, instruments, etc., can solve the problems of difficulty in detecting non-metallic elements, easy heating and damage of discharge tubes, and high maintenance costs, and achieve discharge stability. Strong, easy-to-operate, sensitive to detect effects

Pending Publication Date: 2017-12-01
DALIAN UNIV OF TECH
View PDF5 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The invention can not only solve the defects that the inductively coupled plasma spectrometer is difficult to detect non-metallic elements and high maintenance costs, but also can solve the problems that the microwave plasma has too low a sample tolerance and the discharge tube is easy to heat and damage under high power, and the instrument system simple and easy to operate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Trace element detection device based on plasma surface wave excitation
  • Trace element detection device based on plasma surface wave excitation
  • Trace element detection device based on plasma surface wave excitation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The present invention will be further described below in combination with specific embodiments.

[0027] The trace element detection device based on plasma surface wave excitation of the present invention mainly includes a plasma excitation source generation system 1 , an atomization system 2 , a spectrum detection system 3 and a cooling system 4 .

[0028] The trace element detection device detects trace elements. The plasma excitation source generation system 1 is mainly responsible for obtaining the argon plasma source through plasma surface wave discharge under atmospheric pressure; the atomization system 2 is mainly responsible for atomizing the liquid sample to be tested , converting the liquid sample into a gas phase sample, passing the carrier gas and the gas phase sample into the discharge tube 7 through the inlet 9, so that the gas phase sample to be measured interacts with the plasma in the discharge tube 7 to excite the characteristic spectrum of the elements...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a trace element detection device based on plasma surface wave excitation and belongs to the field of trace element detection. The trace element detection device comprises a plasma excitation source generation system, an atomization system, a spectrum detection system and a cooling system. Working gas is injected from the upstream of a discharge tube, an energy coupling area of a surface wave plasma exciter generates plasma, and the generated surface wave plasma can extend to an outlet end of the discharge tube; a to-be-detected liquid sample after being treated by a pneumatic atomizing device forms a gaseous-phase sample, the gaseous-phase sample is led into the surface wave plasma by a lead-in port through a quartz lead-in tube, elements in the to-be-detected sample are excited by the surface wave plasma to generate feature spectra which are received by an optical fiber probe at an observation window for spectrum detection and transmitted to a spectrograph, and a computer analyzes feature excitation lines of the to-be-detected sample to realize qualitative and quantitative analysis of to-be-detected trace elements in the to-be-detected sample. The trace element detection device can improve bearing capacity of microwave plasma to the gaseous-phase sample and is simple in structure and convenient to operate.

Description

technical field [0001] The invention belongs to the field of trace element detection, and relates to a spectrometer for detecting trace amounts of heavy metal or non-metal components in a sample, in particular to an atomic emission spectrometer using surface wave plasma as an excitation source. Background technique [0002] In recent years, pollution incidents related to heavy metals and non-metals are frequent, and the pollution is quite serious, which is very harmful to the environment and organisms. Heavy metals can be enriched through the food chain and enter the human body. The damage to human organs is irreversible, resulting in death. Non-metal pollution also causes great harm to the human body, and can even lead to death in severe cases. The sources of these pollutions are extremely extensive, involving all walks of life, mainly including industrial pollution sources such as metal smelting, combustion, batteries, mechanical processing, and chemical synthesis, agricul...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N27/68
CPCG01N27/68
Inventor 李寿哲白阳
Owner DALIAN UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products