Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and equipment for mura calibration of display panel

A calibration method and panel technology, applied in the field of mura calibration, can solve problems such as yield loss and product quality degradation, and achieve the effect of avoiding unnecessary yield loss

Active Publication Date: 2020-12-25
WUHAN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a method and equipment for mura calibration of a display panel, which can avoid unnecessary loss of yield rate caused by too large demarcated range and lower product quality caused by too small demarcated area when determining mura demarcated area

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and equipment for mura calibration of display panel
  • Method and equipment for mura calibration of display panel
  • Method and equipment for mura calibration of display panel

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0012] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0013] see figure 1 , figure 1 It is a schematic flowchart of an embodiment of the mura calibration method of the display panel of the present invention. In this embodiment, the mura detection of the panel exists in each process flow of the panel preparation, that is, the panel will be subjected to mura detection after each process flow. to determine the precise area where the mura of the panel exists. In the actual production process, mura may appear in man...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a mura calibration method and equipment for a display panel. The method comprises the following steps: the panel is placed on a frame structure of mura detection equipment; light is projected to the panel to detect a mura area in the panel; a point fixing device on the mura detection equipment is moved to the mura area, so that the mura area can be delimited precisely. According to the scheme, the problems that unnecessary yield loss is caused by too large range during delimiting of the mura area and product quality is reduced due to too small delimited area can be solved.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a mura calibration method and equipment for a display panel. Background technique [0002] In the production of display panels, Mura is one of the main factors affecting the yield of display panels. Among them, Mura means smear in Japanese, and means a defect in which a specific area is displayed unevenly when the entire screen is displayed with a constant gray scale. [0003] In the factory production, the Macro machine is used to check the mura status. After film formation, yellow light, peeling, laser annealing and other processes, the substrate is irradiated with lights from different angles, and manual observation is performed to confirm whether there is mura. The distribution of mura on the substrate is also very irregular. If manual confirmation is used, there is a problem that the boundary of mura cannot be clearly indicated, resulting in the risk of excessive scrapping...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/95
CPCG01N21/95
Inventor 赵瑜高天华
Owner WUHAN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com