Method for measuring position of polyimide thin film and alignment marker
A polyimide film and alignment mark technology, which is applied in optics, instruments, nonlinear optics, etc., can solve the problems of non-compliance of liquid crystal display panels, inability to accurately adjust PI film, and influence of liquid crystal display panels
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[0032] The invention provides a method for measuring the position of a polyimide film. The method for measuring the position of a polyimide film comprises the following steps:
[0033] Such as figure 1 As shown, a substrate 2 is provided, and an alignment mark 1 is printed on the substrate 2. The alignment mark 1 is a symmetrical regular figure, and the center of the alignment mark 1 coincides with the center of the substrate 2; The longitudinal direction of the alignment mark 1 is consistent with the longitudinal direction of the substrate 2 , and the width direction of the alignment mark 1 is consistent with the width direction of the substrate 2 .
[0034] With the center of the alignment mark 1 as the origin, mark the scale on the alignment mark 1 according to the preset interval.
[0035] Prepare the polyimide film on the side with the alignment mark 1 printed on the substrate 2, measure the position of the polyimide film on the substrate 2 according to the scale of the ...
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