Microwave-enabled atom back pumping-based detection system and method applied to atom interferometer

A technology of atomic interferometer and detection system, applied in the direction of radiation measurement, instruments, measuring devices, etc., can solve the problems of uneven background light intensity, increase of optical devices, etc., achieve the effect of simple optical path structure and realization of timing control

Pending Publication Date: 2017-09-22
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

[0008] Aiming at the defects of the prior art, the object of the present invention is to provide a detection system and method based on microwave back-pumping atoms in an atomic interferometer, aiming to solve the need for fast switching of laser beams and generation of multiple laser frequencies in the prior art It leads to the increase of optical devices, and the problem that the background light intensity is not uniform compared with the other beam of single frequency because one of the two probe beams is synthesized by different spots of two laser frequencies

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  • Microwave-enabled atom back pumping-based detection system and method applied to atom interferometer
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  • Microwave-enabled atom back pumping-based detection system and method applied to atom interferometer

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[0029] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

[0030] The invention relates to a method for detecting the number of atoms in superimposed quantum states in an atom interferometer; aiming at the above-mentioned defects of the prior art of time-sharing fluorescence detection, a detection method with simple timing control, few optical devices, strong feasibility and high precision is provided.

[0031] The invention provides a detection system based on microwave back-pumping atoms in an atom interferometer, which comprises: a laser light source module, a detection optical path, a microwave frequency source device, an atom imaging device an...

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Abstract

The present invention discloses a microwave-enabled atom back pumping-based detection system and method applied to an atom interferometer. The detection system comprises a laser light source, a microwave frequency source, a detection optical path, an atomic imaging device and a time sequence control module; after being interfered, falling atoms are in an a quantum state and a b quantum state, and interact with a beam of detection light which is horizontally located at an upper part in space, so as to generate fluorescent light; the number information Nb of the b-quantum state atoms is obtained through an imaging system; in a continuous falling process, the quantum-state atoms are removed from a detection region; before entering a beam of detection light which is horizontally located at a low part in space, another kind of a-quantum state atoms are back pumped to a b-quantum state through a microwave back pumping method, wherein the b-quantum state can interact with the detection light; and after remaining atomic groups pass through the lower detection light beam and generate fluorescent light, the number information Na of the a-quantum state atoms is obtained. The optical path structure of the detection system of the invention is simple and compact; the frequencies of the upper laser beam and lower laser beam are identical; the intensity of background light is constant; a microwave source can be turned on and turned off quickly; and the detection system has high practicability.

Description

technical field [0001] The invention belongs to the field of atomic and molecular physics, and more particularly, relates to a detection system and method based on microwave back-pumping atoms in an atomic interferometer. Background technique [0002] Over the past few decades, atomic interferometry has rapidly developed into a powerful tool in precision measurements. Because of its potential high sensitivity, it has been used in the field of precision measurement to test some basic principles of physics and explore new physical fields; at the same time, it also has important application prospects in engineering fields such as resource exploration and gravity-assisted navigation. [0003] After the atoms of the atomic interferometer interact with the laser to complete the interference process, the interference phase shift is characterized by the transition probability in a certain quantum state. This quantity can be calculated by measuring the proportion of the number of at...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/29
CPCG01T1/29G01T1/2914
Inventor 胡忠坤崔嘉丰段小春徐耀耀漆坤周敏康
Owner HUAZHONG UNIV OF SCI & TECH
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