Electronic device and power management method thereof

Abstract

The invention relates to a power management method of an electronic device. The power management method comprises the steps that temperature is sensed; normal-temperature parameter sets and high-temperature parameter sets are obtained, wherein the operation power of a processor of the electronic device during operation by using the high-temperature parameter sets is higher than that during operation by using the normal-temperature parameter sets; when it is determined that the sensed temperature is not greater than a high-temperature critical value, current parameter sets are replaced by the normal-temperature parameter sets to run the processor; when the sensed temperature is greater than the high-temperature critical value, the current parameter sets are replaced by the high-temperature parameter sets to run the processor. The complete efficiency of the processor can be effectively played, and the problem of poor efficiency of the processor under high temperature can be effectively solved.

Description

【Technical field】 [0001] The present invention relates to devices and methods, in particular to electronic devices and power management methods thereof. 【Background technique】 [0002] Rugged electronic devices (such as various military-grade laptops, tablet computers or wearable devices) are mainly designed to be used in extreme environments (such as deserts or polar regions), and have high temperature resistance, low temperature resistance, dust resistance, and impact resistance and shockproof properties. In addition, compared with general electronic devices (the operating temperature range is about 0 degrees Celsius to 45 degrees Celsius), the electronic components (such as processors, hard disks or memory) configured in rugged electronic devices have special hardware structures (such as heating layers and High-efficiency heat dissipation device), with a wider operating temperature range (such as minus 40 degrees Celsius to 60 degrees Celsius). [0003] Although existin...

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Problems solved by technology

[0004] The above inhibition mechanism will greatly inhibit the performance of the processor at high temperature, thus making the processor performance of the existing rugged electronic device poor at high temperature

[0005] In addition, when the operating temperature of the processor does not reach the critical temperature (such as 60 degrees Celsius) that will cause thermal overload under high temperature (such as 45 degrees Celsius), the existing rugged electronic device will still automatically execute the above suppression mechanism ( If the temperature of the processor exceeds 40 degrees Celsius, the performance of the processor will be gradually suppressed), which makes the performance of the processor prematurely suppressed and unable to effectively exert its full performance

[0006] In addition, the existing rugged electronic devices control the performance of the processor with the same suppression method (i.e., adjusting the same setting parameters) at room temperature or high temperature, which cannot make the processor effectively play its full performance

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