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Method for quickly measuring average critical current of superconducting film

A technology of superconducting thin film and critical current, which is applied in the field of superconducting electrical engineering to achieve the effects of avoiding inaccurate positioning, saving measurement time, and being simple and easy to operate

Active Publication Date: 2017-09-08
SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] The main purpose of the present invention is to make up for the deficiencies of the above-mentioned existing measurement methods, and propose a method for measuring the average critical current of superconducting thin films that is easy to operate, fast and has high measurement accuracy, so as to solve the problems of measurement efficiency and existing measurement methods. The technical problem that measurement accuracy is difficult to take into account at the same time

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  • Method for quickly measuring average critical current of superconducting film
  • Method for quickly measuring average critical current of superconducting film
  • Method for quickly measuring average critical current of superconducting film

Examples

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Embodiment 1

[0078] In this implementation, the average critical current I of the square superconducting thin film sample is c measurement, refer to figure 2 , the measurement process includes the following steps:

[0079] Step 1, measure the side length of the square superconducting thin film sample to be tested with a size measuring tool, and obtain the side length a of the sample;

[0080] Step 2. The sample to be tested after the measurement in step 1 is placed in a low temperature maintenance device for cooling, wherein the temperature in the low temperature maintenance device is lower than the critical transition temperature T of the superconducting thin film to be tested c ;

[0081] Step 3. When the sample to be tested is cooled to its superconducting state, use an electromagnet or a permanent magnet to excite it to generate a circular current inside, wherein the excitation magnetic field is greater than or equal to the penetrating magnetic field of the superconducting film to b...

Embodiment 2

[0088] The difference between this embodiment and Embodiment 1 is that it is aimed at a rectangular superconducting thin film sample, and the geometric dimensions have a width a and a length b. Refer to image 3 , through the same steps as steps 1 to 7 in Example 1, apply formula (12), obtain the I of the rectangular sample to be tested c value. Also assign values ​​to each parameter in formula (12), for example, the average critical current I of the rectangular sample to be tested c is 22500A / m, the height h of the magnetic field measuring device from the superconducting thin film sample is 0.001m, the variation range of width a and length b is 0.001m to 0.05m, a, b, I c , h into the formula (12), using Matlab can get the B of the rectangular superconducting thin film c -a-b curve relationship image, such as Figure 10 As shown; as another example, the width a of the rectangular superconducting film sample is 0.005m, the length b is 0.01m, and the average critical current ...

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Abstract

A method for quickly measuring average critical current of a superconducting film comprises the steps of measuring the geometric dimension of a to-be-measured superconducting film sample; cooling the to-be-measured sample to a superconducting state and performing excitation; scanning and measuring a magnetic induction strength B at a geometric center area of the to-be-measured sample by means of a magnetic field measurement device; determining the coordinate of a geometric center point of the to-be-measured sample by means of a maximal value of B; fixing a magnetic field measuring device at a position right above or right below the geometric center point at a distance h for measuring a magnetic induction intensity B which is generated by the to-be-measured sample at the magnetic field measuring device fixing part; performing all above steps on a superconducting film with known average critical current Ic for obtaining the Bc value of the comparing sample; and according to a relationship among Bc, h, Ic and the geometric dimension of the superconducting film, obtaining value of the h based on the geometric dimension of the comparing sample through measurement, Bc value and the known Ic value, and introducing the value of h, the geometric dimension of the to-be-measured sample and the Bc value into the relationship, thereby obtaining the Ic value of the to-be-measured sample.

Description

technical field [0001] The invention relates to the field of superconducting electrical engineering, in particular to a method for quickly measuring the average critical current of a superconducting thin film. Background technique [0002] Superconducting materials can be widely used in large-scale electric devices due to their characteristics of no DC resistance and the ability to carry a large amount of current. The critical current is a very important parameter index of superconducting thin films, which reflects the current carrying capacity of superconducting thin films. The most basic parameters. At present, there are two main types of methods for measuring the critical current of superconducting thin films: the first type is contact type, and the second type is non-contact type. [0003] The contact measurement method, that is, the "four-wire method", the principle of measurement is to connect a current lead and a voltage lead at each end of the sample, gradually incr...

Claims

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Application Information

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IPC IPC(8): G01R33/12
CPCG01R33/1246
Inventor 冯峰母辉瞿体明顾晨符其树
Owner SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
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