Multi-data source-based intelligent inspection system of substation and integral diagnostic method
A technology of intelligent inspection and multiple data sources, applied in the direction of electrical components, circuit devices, etc., can solve the problems of insufficient inspection methods, one-sidedness, combined with comprehensive judgment, etc., and achieve the effect of intelligent unmanned inspection
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0038] An intelligent inspection system for substations based on multiple data sources, which includes an intelligent inspection system for primary equipment, an intelligent inspection system for primary equipment, an intelligent inspection system for secondary equipment, and an on-line monitoring data source in the station through a network security communication transmission system in the station. Integrated business data platform connection.
[0039] The on-line monitoring data source in the station is isolated from the network security communication transmission system in the station through an isolation device.
[0040] The comprehensive business data platform is connected with the off-site background expert diagnosis system through the network.
[0041] Among them, the integrated business data platform is installed in the dispatching center, and other systems and devices are installed in the substation.
[0042] The inspection content of the primary equipment intelligen...
PUM
![No PUM](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com