Abnormity determining method for low-resolution infrared image
An infrared image and abnormal situation technology, applied in the direction of instruments, character and pattern recognition, computer parts, etc., can solve the problem of inaccurate image judgment, and achieve high judgment accuracy, low false alarm rate, and low computational complexity. Effect
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[0027] All the features disclosed in this specification, except mutually exclusive features and / or steps, can be combined in any way.
[0028] Combine below figure 1 The present invention will be described in detail.
[0029] Any feature disclosed in this specification (including any appended claims, abstract and drawings), unless expressly stated otherwise, may be replaced by alternative features which are equivalent or serve a similar purpose. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.
[0030] In the present invention, at first the system is trained, and the training steps include:
[0031] Step 1: Perform image label classification on N sleep passive far-infrared images with a resolution of m×n, and perform image preprocessing on the N sleep passive far-infrared images after label classification. The preprocessing process includes image interpolation, smoothing, and normalization. Any exist...
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