Depth information acquiring device and method on basis of TOF technology and binocular vision
A technology of depth information and binocular vision, which is applied in the direction of measuring devices, electromagnetic wave reradiation, character and pattern recognition, etc., can solve the problems of increasing system structure complexity and system cost, long measurement time, high hardware requirements, etc., to reduce Unrecognizable and misidentified risks, reduced algorithm complexity and calculation time, good stability and reliability
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[0028] like figure 1 As shown, a depth information acquisition device combining TOF technology and binocular vision includes an active light source emitting device 1, a TOF sensor 2, a left image sensor 3, a right image sensor 4, a controller 5 and a processor 6; figure 2 As shown, the active light source emitting device 1 includes a light source 7, a spatial modulation device 8 and an imaging system 9 arranged in sequence; the active light source emitting device 1 and the light source 7 are connected to the controller 5, the TOF sensor 2, the left image sensor 3 and the The right image sensors 4 are all connected to the processor 6;
[0029] In this embodiment, the left image sensor 3 and the right image sensor 4 are symmetrically arranged on both sides of the TOF sensor 2, and the left and right image sensors and the TOF sensor 2 use a spectroscopic method to collect images and depth information under the same conditions. The reflectivity information obtained by the left a...
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