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A method and device for measuring the geometric dimension of a gap in a free-form surface

A technology of geometric dimensions and measurement methods, applied in measurement devices, optical devices, image analysis, etc., can solve the problem of difficulty in automatic measurement of gap geometric dimensions, and achieve clear and intuitive detection results, good repeatability, and high detection accuracy. Effect

Active Publication Date: 2019-04-05
CHONGQING ACAD OF METROLOGY & QUALITY INST
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  • Claims
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Problems solved by technology

[0003] The contour of the gap in the free-form surface product has irregular shape characteristics, which makes it difficult to automatically measure the geometric size of the gap

Method used

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  • A method and device for measuring the geometric dimension of a gap in a free-form surface
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  • A method and device for measuring the geometric dimension of a gap in a free-form surface

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Embodiment Construction

[0044] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0045] See figure 1 , figure 1It is a flow chart of the first embodiment of the method for measuring the geometric dimension of the gap in the free-form surface of the present invention. The method for measuring the geometric dimension of the gap in the free-form surface of the present embodiment comprises the following steps:

[0046] S1. Gap image acquisition step: segmentally collect the gap images of the free-form surface product to be tested;

[0047] ...

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Abstract

The invention discloses a geometric size measuring method and a device for a slit inside free-form surface. The geometric size measuring method for the slit inside free-form surface comprises the steps of acquiring a slit image: conducting the segmented acquisition of the slit image of a to-be-measured free-form surface product; processing the slit image: processing each segment of the acquired slit image so as to obtain a slit cross-sectional profile, and positioning the edge feature points of each segment of the slit profile, the inflection point of the slit profile, the highest point of the slit profile and the lowest point of the slit profile; conducting the registering and splicing operation: registering and splicing all segments of the processed slit profile; conducting the segmented fitting operation: conducting the segmented fitting for the feature points of the slit profile after the registering and splicing operation so as to obtain an overall slit profile containing the lowest-point curve, the edge curve and the highest-point curve of a slit; and acquiring the geometric size of the slit: according to the fitted curve, acquiring the depth, the length and the width of the slit.

Description

technical field [0001] The invention relates to the technical field of product measurement, in particular to a method and device for measuring the geometric dimension of a gap in a free-form surface. Background technique [0002] In advanced manufacturing fields such as aerospace, high-speed rail, ships, and automobiles, free-form surface products are widely used. There are often gaps in free-form surface products or in the assembly process of different products. Whether the geometric dimensions of the gap meet the design requirements will directly affect the quality and service life of the final product. Therefore, high-precision measurement of the geometric dimensions of the gap between free-form surface products very critical. The traditional free-form surface geometric measurement often uses a contact three-coordinate measuring machine, which can achieve high measurement accuracy, but the measurement efficiency is low, especially affected by the material of the measured...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/60G06T3/40G06T7/13G01B11/00
CPCG01B11/00G06T3/4038
Inventor 周森徐健陶磊吴小丽熊俊唐璟
Owner CHONGQING ACAD OF METROLOGY & QUALITY INST
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