An automatic method for burning memory power fru id

Abstract

The invention discloses an automation method for programming a memory power source fru id and relates to a memory testing technology. The method is characterized in that an automation script compiled by a perl language under linux is used; hardware information is grasped by a serial port and an SAS line; in combination with the automation script, programming and testing of the memory power source fru id can be completed. The method mainly comprises the steps that (1) serial numbers of a memory case and I / O are scanned; (2) the I / O type is judged automatically, and a drive program is loaded automatically; (3) hardware is detected; (4) a serial number of the power source is scanned; (5) the power source fru id is programmed; (6) the programming is completed, and a machine is restarted automatically; and (7) after restarting, whether the fru id is programmed successfully is judged. According to the invention, unnecessary man-machine interaction courses are reduced; consumption of resources such as manpower, times and cost is reduced; testing efficiency and testing accuracy are increased; the coverage rate of the testing is very high; and product delivery quality can be ensured.

Description

Technical field [0001] The present invention relates to a memory testing technology, in particular to an automated method for burning a memory power fru id. Background technique [0002] With the advent of the information processing era, computer systems are widely used in various industries. For organizations that value communication quality, important information is stored in the computer system. Therefore, the operating quality of the computer system is very important. [0003] The memory is an important part of the computer, used to store the information (programs and data) needed by the computer to work, and constitute the information memory function of the computer. The stable power supply of the memory power supply plays a key decisive role in the operating quality of the computer system. In order to save costs, the memory power supply is designed to contain multiple power FRUs (Field Replace Unit). When the memory power fails, only the faulty power FRU needs to be detected...

AI Technical Summary

Problems solved by technology

At present, the fru id programming and testing of the memory power supply are mainly operated manually, which requires a large number of human-computer interaction processes. This inevitably leads to errors caused by human factors, resulting in inaccurate testing, long testing time and low efficiency. Simultaneous testing The coverage rate is low, the test control is not comprehensive enough, and the problematic products cannot be completely intercepted, so that the product quality cannot be guaranteed

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