An automatic method for detecting hard disk backplane in memory under linux

Abstract

The invention discloses an automatic method for detecting a hard disk backplane in a memory under linux, relates to the technical field of computer servers, uses an automatic test program written in perl language under linux, and connects data such as a memory I / O serial port and a SAS line at the server end Transmission line, the program reads the information under the system and the backplane programming information through the I / O serial port and the SAS line, and then grabs the database information by scanning the external barcode and compares it with it to judge the use and programming of the backplane and the status of the external barcode. The usage status; at the same time, compare with the physical state to indicate which slot has a problem with the hard disk; finally, read the signal of the hard disk backplane by calling other modules to judge the specific status of the backplane. The method can test hard disk backplanes in all types of storage, has high test speed, accurate positioning of problems, and high test coverage.

Description

technical field [0001] The invention relates to the technical field of computer servers, in particular to an automatic method for detecting a hard disk backplane in a memory under Linux. Background technique [0002] With the continuous development of the current server and memory fields and the rapid advancement of technology, the market demand for memory is gradually increasing, the company's shipments are increasing, and the testing requirements for R&D and production are getting higher and higher. The testing field is facing severe challenges; being able to achieve production scheduling and shipment on time is not only related to the company's reputation but also represents a company's production capacity, and also affects customer satisfaction, and product testing can be completed efficiently is a crucial part. At present, the K1 product has entered the mass production stage, and the demand is huge. At the same time, the testing work is also facing severe challenges, e...

AI Technical Summary

Problems solved by technology

At present, the K1 product has entered the mass production stage, and the demand is huge. At the same time, the test work is also facing severe tests, especially the test of the storage end is extremely important. At present, the test efficiency of the storage end is low, and the test coverage rate cannot meet the product quality requirements.

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